NASA NTRS · 20030025415
Current Single Event Effects and Radiation Damage Results for Candidate Spacecraft Electronics
Abstract
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, total ionizing dose and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.
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OBryan, Martha V., LaBel, Kenneth A., Reed, Robert A., Ladbury, Ray L., Howard, James W., Jr., Kniffin, Scott D., Poivey, Christian, Buchner, Stephen P., Bings, John P., Titus, Jeff L.. 2002-01-01. Current Single Event Effects and Radiation Damage Results for Candidate Spacecraft Electronics. https://ntrs.nasa.gov/citations/20030025415
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