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NASA NTRS · 20060030076

Total dose bias dependency and ELDRS effects in bipolar linear devices

Yui, C. C.·McClure, S. S.·Rex, B. G.·Lehman, J. M.·Minto, T. D.·Wiedeman, M.
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Abstract

Total dose tests of several bipolar linear devices show sensitivity to both dose rate and bias during exposure. All devices exhibited Enhanced Low Dose Rate Sensitivity (ELDRS). An accelerated ELDRS test method for three different devices demonstrate results similar to tests at low dose rate. Behavior and critical parameters from these tests are compared and discussed.

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Yui, C. C., McClure, S. S., Rex, B. G., Lehman, J. M., Minto, T. D., Wiedeman, M.. 2002-07-15. Total dose bias dependency and ELDRS effects in bipolar linear devices. https://ntrs.nasa.gov/citations/20060030076

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NASA NTRS2002

Total dose dependency and ELDRS effects on bipolar linear devices

The use of bipolar linear devices is prevalent in most satellite and some space applications. However, degradation as a result of low dose irradiations known as ELDERS (effects of enhanced low dose rate sensitivity) is a major concern when selecting flight hardware. Many studies and reports have been conducted on this possible phenomenon as well as their responsible physical mechanisms.

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