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NASA NTRS · 20120000671

Impulse Testing of Corporate-Fed Patch Array Antennas

Abstract

This paper discusses a novel method for detecting faults in antenna arrays. The method, termed Impulse Testing, was developed for corporate-fed patch arrays where the element is fed by a probe and is shorted at its center. Impulse Testing was devised to supplement conventional microwave measurements in order to quickly verify antenna integrity. The technique relies on exciting each antenna element in turn with a fast pulse (or impulse) that propagates through the feed network to the output port of the antenna. The resulting impulse response is characteristic of the path through the feed network. Using an oscilloscope, a simple amplitude measurement can be made to detect faults. A circuit model of the antenna elements and feed network was constructed to assess various fault scenarios and determine fault-detection thresholds. The experimental setup and impulse measurements for two patch array antennas are presented. Advantages and limitations of the technique are discussed along with applications to other antenna array topologies

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BibTeXRIS

Chamberlain, Neil F.. 2011-03-05. Impulse Testing of Corporate-Fed Patch Array Antennas. https://ntrs.nasa.gov/citations/20120000671

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