NASA NTRS · 20170009469
Single Event Effect Testing of the Micron MT46V128M8
Abstract
The Micron MT46V128M8 was tested for single event effects (SEE) at the Texas AM University Cyclotron Facility (TAMU) in June of 2017. Testing revealed a sensitivity to device hang-ups classified as single event functional interrupts (SEFI) and possible soft data errors classified as single event upsets (SEU).
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Stansberry, Scott, Campola, Michael, Wilcox, Ted, Seidleck, Christina, Phan, Anthony. 2017-09-30. Single Event Effect Testing of the Micron MT46V128M8. https://ntrs.nasa.gov/citations/20170009469
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