Search NASA⌕ Search
Home/Archive/NASA NTRS

NASA NTRS · 20210005385

The Keck Interferometer

Walker, J. M.·Wizinowich, P. L.·Wallace, J. K.·Vasisht, G.·van Belle, G. T.·Shao, M.·Meinel, A. B.·Crawford, S. L.·Boden, A. F.·Swanson, P. N.·Colavita, M. M.
View original source ↗Export metadata ↓

Abstract

The Keck Interferometer is being developed by JPL and CARA as one of the ground-based components of NASA's Origins Program. The interferometer will combine the two 10-m Keck telescopes with four proposed 1.8-m outrigger telescopes located at the periphery of the Keck site on Mauna Kea.

Explore related subjects

opticalinterferometryastrometrynullingsynthesisimagingexozodiacaldustextrasolarplanets

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Walker, J. M., Wizinowich, P. L., Wallace, J. K., Vasisht, G., van Belle, G. T., Shao, M., Meinel, A. B., Crawford, S. L., Boden, A. F., Swanson, P. N., Colavita, M. M.. 1998-03-01. The Keck Interferometer. https://ntrs.nasa.gov/citations/20210005385

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

NASA NTRS2017

HabEx Optical Telescope Assembly

Purpose: a) Introduce candidate optical telescope assembly (OTA) architectures. b) Illustrate design/analysis process. Agenda: a) Definitions, Specification & Assumptions. b.) 4-meter Monolithic Mirror Concept. c) 6.5-meter Segmented Mirror Concept.

optical↗
NASA NTRS2003

Optical landmark detection for spacecraft navigation

In this paper, a new crater detection algorithm is suggested. Experimental studies show that this new algorithm can achieve sub-pixel accuracy in position, its detection rate is better than 90% and its false alarm rate is less than 5%. These good characteristics indicate that it is an ideal crater detection algorithm for spacecraft optical navigation.

optical↗
NASA NTRS2002

Diffraction hardware testbed and model validation

Optical systems, which operate over a wide range of Fresnel numbers, are often times performance-limited by diffraction effects. In order to characterize such effects at the 40-100 picometer level, a diffraction testbed has been built which has the capability of measuring diffraction effects at this level. Concurrently, mathematical diffraction modeling tools have been developed that propagate an input wavefront through an optical train, while retaining amplitude and phase information at a grid resolution sufficient for yielding picometer-resolution diffraction test data. This paper contains a description of this diffraction hardware testbed, the diffraction modeling approach, and a comparison of the modeled and hardware test results, which then serves as validation of the diffraction modeling methodology.

optical↗