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NASA NTRS · 20210005504

Microchannel Gate Temperature Analysis

Abstract

Photoemission spectra of a GaAs gate material of a metal semiconductor field effect transistor (MESFET) were analyzed to nondestructively assess the submicron-size local gate temperature.

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BibTeXRIS

Kayali, S., Kim, Q.. 1998-08-01. Microchannel Gate Temperature Analysis. https://ntrs.nasa.gov/citations/20210005504

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Photoemission