NASA NTRS · 20210005530
Retroreflector Diffraction Modeling
Abstract
The SIM metrology subsystem utlizes cornercube retroreflectors as fiducials.
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Schmidtlin, E., Redding, D., Shaklan, S., Loiseau, S.. 1998-03-20. Retroreflector Diffraction Modeling. https://ntrs.nasa.gov/citations/20210005530
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