NASA NTRS · 20240015425
A Screening Method Using Pulsed Power Combined with Infrared Imaging to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors
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Jay Brusse, Lyudmyla Ochs. 2024-12-31. A Screening Method Using Pulsed Power Combined with Infrared Imaging to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors. https://ntrs.nasa.gov/citations/20240015425
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