DOE OSTI · 1128706
Sub-microsecond-resolution probe microscopy
Abstract
Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.
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Ginger, David, Giridharagopal, Rajiv, Moore, David, Rayermann, Glennis, Reid, Obadiah. 2014-04-01. Sub-microsecond-resolution probe microscopy. https://www.osti.gov/biblio/1128706
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