DOE OSTI · 1237213
Post-Mortem Characterization of Shocked Cu-Be Interfaces Using Electron Backscattered Diffraction (EBSD)
Abstract
The source did not provide an abstract. Follow the original record for more information.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Tegtmeier, Eric Lee, Hammerberg, James Edward, Loomis, Eric Nicholas, Papin, Pallas Athene, Cooley, Jason Christopher, Gray, George Thompson. 2016-01-27. Post-Mortem Characterization of Shocked Cu-Be Interfaces Using Electron Backscattered Diffraction (EBSD). https://www.osti.gov/biblio/1237213
Cite the original work for its findings. Save a collection to share your selection of sources.