Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

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Levine, A, Bu, G., Biswas, S., Tsai, E., Braunschweig, A., Nannenga, B.. 2022-01-01. Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering. https://doi.org/10.1039/d0cc00119h

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