DOE OSTI · 1768350
Understanding Electrothermal Instability Growth by Comparing Z-Pinches with Engineered Defects to 3D-MHD Simulations.
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Awe, Thomas James, Yu, E. P., Hutchinson, T. M., Bauer, B. S., Hatch, M. W., Shipley, G. A., Hutsel, B. T.. 2020-02-01. Understanding Electrothermal Instability Growth by Comparing Z-Pinches with Engineered Defects to 3D-MHD Simulations.. https://www.osti.gov/biblio/1768350
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