DOE OSTI · 1783564
Chapter 10: Nanometer-Scale Characterization of Thin-Film Solar Cells by Atomic Force Microscopy-Based Electrical Probes
Abstract
KPFM and SSRM, which relate to the following characterization reviews, will be introduced briefly in Section 10.2. Some recent nm-scale characterizations of perovskite, CIGS, and CdTe thin-film solar cell materials and devices will be reviewed in Sections 10.3-10.5 and closing remarks will be given in Section 10.6.
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Jiang, Chun-Sheng. 2020-09-01. Chapter 10: Nanometer-Scale Characterization of Thin-Film Solar Cells by Atomic Force Microscopy-Based Electrical Probes. https://doi.org/10.1049/pbpo166e_ch10
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