DOE OSTI · 1848347
High-permittivity dielectric edge termination for vertical high voltage devices
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Lee, Hyun-Soo, Kalarickal, Nidhin Kurian, Rahman, Mohammad Wahidur, Xia, Zhanbo, Moore, Wyatt, Wang, Caiyu, Rajan, Siddharth. 2020-08-03. High-permittivity dielectric edge termination for vertical high voltage devices. https://doi.org/10.1007/s10825-020-01553-y
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