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DOE OSTI · 1974830

Crack Growth Rate at Oxygen Electrode/Electrolyte Interface in Solid Oxide Electrolysis Cells Predicted by Experiment Coupled Multiphysics Modeling

Jayapragasam, Puvikkarasan (ORCID:0000000323775557)·Wen, Yeting·Cook, Korey·Wrubel, Jacob A. (ORCID:0000000233470768)·Ma, Zhiwen·Huang, Kevin (ORCID:0000000212324593)·Jin, Xinfang (ORCID:0000000231484904)
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Abstract

Solid oxide electrolysis cell (SOEC) is a very efficient hydrogen production technology, but the cell degradation is a serious limiting factor for its long-term implementation. Oxygen electrode (OE) delamination is reported to be the critical degradation mechanism. In this study, we present a methodology to understand the delamination failure of the OE due to chemical stress in a better perspective. Several OE configurations were tested: baseline strontium-doped lanthanum cobalt iron oxide (LSCF) single layer design and tantalum-doped strontium cobalt oxide (SCT) - LSCF bilayer designs with different SCT loadings. An electro-chemo-mechanical model is developed to associate the electrochemical behavior of the cell with solid mechanics for calculating crack growth of the cell during long term test. The bilayer configuration with SCT 20 wt% has better performance as it survived in the long-term life test with the least crack length. This study implies that an additional nano-coating of SCT over the OE have improved the species transport and oxygen evolution with reduced chemical stress. As the operating current density decreases, it takes longer time for the cell to reach the delamination with the same critical crack length of 6.5 μ m (∼93% of the electrode/electrolyte interface length). Finally, it was concluded that chemical stress plays a significant role in interface delamination failure, however it may not be the only source of stresses at the interface.

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08 HYDROGEN30 DIRECT ENERGY CONVERSIONchemical stressoxygen electrode delaminationsolid oxide electrolysis cell

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Jayapragasam, Puvikkarasan (ORCID:0000000323775557), Wen, Yeting, Cook, Korey, Wrubel, Jacob A. (ORCID:0000000233470768), Ma, Zhiwen, Huang, Kevin (ORCID:0000000212324593), Jin, Xinfang (ORCID:0000000231484904). 2023-05-23. Crack Growth Rate at Oxygen Electrode/Electrolyte Interface in Solid Oxide Electrolysis Cells Predicted by Experiment Coupled Multiphysics Modeling. https://doi.org/10.1149/1945-7111%2Facd4f1

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