DOE OSTI · 1980411
Understanding the Interplay Between CdSe Thickness and Cu Doping Temperature in CdSe/CdTe Devices
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Bastola, Ebin, Phillips, Adam B. (ORCID:0000000226755052), Barros-King, Griffin, Jamarkattel, Manoj K. (ORCID:0000000327675705), Li, Deng-Bing (ORCID:0000000290009724), Quader, Abdul, Pokhrel, Dipendra, Friedl, Jared, Gibbs, Jacob M., Mathew, Xavier, Yan, Yanfa, Ellingson, Randy J. (ORCID:0000000195206586), Heben, Michael J. (ORCID:0000000237883471). 2022-01-01. Understanding the Interplay Between CdSe Thickness and Cu Doping Temperature in CdSe/CdTe Devices. https://doi.org/10.1109/jphotov.2021.3110338
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