Search NASA⌕ Search

DOE OSTI · 1980411

Understanding the Interplay Between CdSe Thickness and Cu Doping Temperature in CdSe/CdTe Devices

Also available from

Abstract

Not provided.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Bastola, Ebin, Phillips, Adam B. (ORCID:0000000226755052), Barros-King, Griffin, Jamarkattel, Manoj K. (ORCID:0000000327675705), Li, Deng-Bing (ORCID:0000000290009724), Quader, Abdul, Pokhrel, Dipendra, Friedl, Jared, Gibbs, Jacob M., Mathew, Xavier, Yan, Yanfa, Ellingson, Randy J. (ORCID:0000000195206586), Heben, Michael J. (ORCID:0000000237883471). 2022-01-01. Understanding the Interplay Between CdSe Thickness and Cu Doping Temperature in CdSe/CdTe Devices. https://doi.org/10.1109/jphotov.2021.3110338

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports