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DOE OSTI · 2228527

Surface analysis insight note: Illustrating the effect of adventitious contamination on Pt photoemission peak intensities

Fairley, Neal [Casa Software Ltd, Teignmouth (United Kingdom)]·Bargiela, Pascal [The Institute for Research on Catalysis and the Environment of Lyon (IRCELYON), Villeurbanne (France)]·Baltrusaitis, Jonas [Lehigh Univ., Bethlehem, PA (United States)] (ORCID:000000015634955X)
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Abstract

Adventitious carbon contaminations are not only omnipresent and used for charge referencing of XPS spectra but also can alter the apparent presence of the element peaks that span over the large spectral window of binding energies. This Insight note describes the effect of an adventitious contamination layer on Pt and presents, in brief, the approach whereby the component spectra are derived for ion beam cleaned Pt samples that can then utilize linear mathematics to peak fit said spectra thus quantifying the amount of each component including that assigned to the contamination itself of Pt metal.

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37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRYChemistryXPSadventitious carboncomponent spectralinear least squaresplatinum

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Fairley, Neal [Casa Software Ltd, Teignmouth (United Kingdom)], Bargiela, Pascal [The Institute for Research on Catalysis and the Environment of Lyon (IRCELYON), Villeurbanne (France)], Baltrusaitis, Jonas [Lehigh Univ., Bethlehem, PA (United States)] (ORCID:000000015634955X). 2023-12-05. Surface analysis insight note: Illustrating the effect of adventitious contamination on Pt photoemission peak intensities. https://doi.org/10.1002/sia.7276

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37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY subjectChemistry subject

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