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DOE OSTI · 23141963

Limiting spectral and angular characteristics of multilayer relief – phase diffraction microstructures

Greisukh, G. I.·Ezhov, E. G.·Antonov, A. I.·Danilov, V. A.
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Abstract

Methods for estimating the parameters of relief – phase diffraction microstructures (local and integral Q-factors) are extended to the case of multilayer double-relief sawtooth microstructures, which makes it possible to select the best combinations of optical materials for multilayer microstructures at a very low computational burden. An approach to the study of multilayer microstructures is proposed, based on the combined use of Q-factors and the method of rigorous analysis of coupled waves, which allows one to estimate the limiting spectral and angular characteristics of multilayer microstructures of various types. (paper)

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71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITYDIFFRACTIONLAYERSMICROSTRUCTURE

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Greisukh, G. I., Ezhov, E. G., Antonov, A. I., Danilov, V. A.. 2020-07-01. Limiting spectral and angular characteristics of multilayer relief – phase diffraction microstructures. https://doi.org/10.1070/qel17278

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