DOE OSTI · 2327106
Development of diamond-based diagnostics for next-generation XFELs
Abstract
The composition and performance of three different diamond sensor based pass-through diagnostics are presented. A position-sensitive quadrant sensor was designed and characterized using the XPP beam at the SLAC LCLS, demonstrating a generated-charge resolution of 0.025 pC and a position sensitivity of 2 μm, measurable pulse-by-pulse at a repetition rate of up to 50 MHz. A compact signal path capable of repetition rates up to 1 GHz was used to characterize the charge collection properties of diamond sensors as a function of the density of electron-hole pairs created within the sensor, finding a limit of approximately 10 16 electron-hole pairs per cm 3 beyond which the collection efficiency and time began to degrade. Finally, a proposed scheme for measuring ionizing radiation at multi-GHz rates is presented, along with results preliminarily demonstrating signal transport capability in excess of 5 GHz.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Padilla, R., Gonzalez, E., Kachiguine, S., Martinez-Mckinney, F., Mazza, S., Nagel, N., Nizam, M., Norvell, N., Potter, E., Ryan, E., Schumm, B. A., Tarka, M., Wilder, M., Jacobson, B., MacArthur, J., Torrecilla, I. Silva, Smedley, J., Zhu, D., Kim, D., Bohon, J., Grace, C., Prakash, T., Harris, C. T., Stuart, D., Freeman, P., Prebys, E., Rowling, C.. 2023-10-16. Development of diamond-based diagnostics for next-generation XFELs. https://doi.org/10.1016/j.nima.2023.168763
Cite the original work for its findings. Save a collection to share your selection of sources.