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DOE OSTI · 2439319

High-Throughput Microstructural Characterization and Process Correlation Using Automated Electron Backscatter Diffraction

Abstract

The need to optimize the processing conditions of additively manufactured (AM) metals and alloys has driven advances in throughput capabilities for material property measurements such as tensile strength or hardness. High-throughput (HT) characterization of AM metal microstructure has fallen significantly behind the pace of property measurements due to intrinsic bottlenecks associated with the artisan and labor-intensive preparation methods required to produce highly polished surfaces. This inequality in data throughput has led to a reliance on heuristics to connect process to structure or structure to properties for AM structural materials. In this study, we show a transformative approach to achieve laser powder bed fusion (LPBF) printing, HT preparation using dry electropolishing and HT electron backscatter diffraction (EBSD). This approach was used to construct a library of > 600 experimental EBSD sample sets spanning a diverse range of LPBF process conditions for AM Kovar. This vast library is far more expansive in parameter space than most state-of-the-art studies, yet it required only approximately 10 labor hours to acquire. Build geometries, surface preparation methods, and microscopy details, as well as the entire library of >600 EBSD data sets over the two sample design versions, have been shared with intent for the materials community to leverage the data and further advance the approach. Using this library, we investigated process–structure relationships and uncovered an unexpected, strong dependence of microstructure on location within the build, when varied, using otherwise identical laser parameters.

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BibTeXRIS

Fowler, J. Elliott, Ruggles, Timothy J., Cillessen, Dale E., Johnson, Kyle L., Jauregui, Luis J., Craig, Robert L., Bianco, Nathan R., Henriksen, Amelia A., Boyce, Brad L.. 2024-06-28. High-Throughput Microstructural Characterization and Process Correlation Using Automated Electron Backscatter Diffraction. https://doi.org/10.1007/s40192-024-00366-2

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