DOE OSTI · 2479016
Sub-micron Glue Thickness Measurement and Uncertainty Determination for Dynamic Material Experiments on NIF
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Hackbarth, J, Mcnaney, J, Eggert, J, Kumar, C, Schiaffino, S, Riddles, J, Wilson, M. 2024-11-21. Sub-micron Glue Thickness Measurement and Uncertainty Determination for Dynamic Material Experiments on NIF. https://www.osti.gov/biblio/2479016
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