DOE OSTI · 2504256
Parallel tempered Bayesian inference for characterizing non-ideal semiconductors: Carrier trapping in cadmium telluride thin films
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Fai, Calvin, Ladd, Anthony J. C. (ORCID:0000000202710650), Hages, Charles J., Manoukian, Gregory A., Baxter, Jason B.. 2025-02-01. Parallel tempered Bayesian inference for characterizing non-ideal semiconductors: Carrier trapping in cadmium telluride thin films. https://doi.org/10.1016/j.isci.2025.111850
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