DOE OSTI · 2540302
Surface Charge Migration in SiC Power MOSFETs Induced by HVDC-H3TRB Testing
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Rummel, Brian Douglas. 2024-03-01. Surface Charge Migration in SiC Power MOSFETs Induced by HVDC-H3TRB Testing. https://doi.org/10.2172/2540302
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