DOE OSTI · 2574055
An Integrated High-Speed Microstructural Characterization Method Using Simultaneous XRD, Stereo-DIC, and PCI
Abstract
High-speed characterization of the deformation mechanisms in polycrystalline metals requires the quantification of full strain fields and local microstructural evolutions simultaneously. In this paper, we present a novel experimental method to integrate phase-contrast imaging (PCI), stereographic digital image correlation (stereo-DIC), and full-ring X-ray diffraction (XRD) to allow for the simultaneous characterization of polycrystalline metals at 1MHz or higher. A Kolsky bar was integrated into the synchrotron X-ray source in Sector 32 ID-B at the Advance Photon Source (APS) at Argonne National Laboratory. When the sample is dynamically loaded, the diagnostic methods of full-ring XRD, PCI, and stereo-DIC are properly synchronized to record the deformation behavior at both continuum and microstructural scales as a function of the loading history. An advanced high-strength steel (AHSS) is used as a model material to demonstrate the capabilities of this new experimental method.
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Kirk, C. D. [Purdue Univ., West Lafayette, IN (United States)] (ORCID:0000000157558257), Roginski, A. R. [Purdue Univ., West Lafayette, IN (United States)], Clark, S. J. [Argonne National Laboratory (ANL), Argonne, IL (United States)], Fezzaa, K. [Argonne National Laboratory (ANL), Argonne, IL (United States)], Chen, W. W. [Iowa State Univ., Ames, IA (United States)]. 2025-06-02. An Integrated High-Speed Microstructural Characterization Method Using Simultaneous XRD, Stereo-DIC, and PCI. https://doi.org/10.1007/s40870-025-00476-8
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