DOE OSTI · 2997341
Characterization, Accelerated Life Testing, and Finite Element Modeling of Low Temperature Solder Wire Interconnect Degradation Mechanisms
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Hartley, James Yuan [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000313764846), Miller, David [National Renewable Energy Laboratory (NREL)], Ulicná, Sona [National Renewable Energy Laboratory (NREL)], Bosco, Nick [National Renewable Energy Laboratory (NREL)], Hacke, Peter [National Renewable Energy Laboratory (NREL)]. 2025-10-01. Characterization, Accelerated Life Testing, and Finite Element Modeling of Low Temperature Solder Wire Interconnect Degradation Mechanisms. https://doi.org/10.1002/pip.70011
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