DOE OSTI · 3005423
Implementation of Johnson Noise Thermometry into Radiation Hardened Electronics
Abstract
The random motion of charge carriers in an electrical conductor is a function of its temperature. This phenomenon generates an electrical signal, referred to as Johnson noise, that is present in all analog signals. Conversely, the temperature dependence of the Johnson noise spectrum also enables a direct measurement of absolute temperature, which can provide a secondary measurement of temperature when quantified using sensors such as resistive temperature devices (RTDs) in a process called Johnson noise thermometry (JNT). For nuclear environments, this is of particular interest in correcting for RTDs signal drift caused by accumulation, transmutation, and displacement damage caused by neutron and gamma irradiation.
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Sweeney, Daniel C. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000212891627), Reed, F. Kyle [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000222804574), Ezell, N. Dianne Bull [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000193345822). 2025-10-01. Implementation of Johnson Noise Thermometry into Radiation Hardened Electronics. https://doi.org/10.2172/3005423
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