DOE OSTI · 3008072
Advanced Characterization in Advanced Manufacturing Workshop
Abstract
The Advanced Manufacturing (AM) Work shop successfully convened experts from government, academia, and industry to address pressing scientific challenges and strengthen the AM user community. The workshop was held at the U.S. Department of Energy’s (DOE) Brookhaven National Laboratory during the National Synchrotron Light Source II (NSLS-II) and Center for Functional Nanomaterials (CFN) Users’ Meeting. Participation included researchers from Stony Brook University, Massachusetts Institute of Technology, Yale University, Harvard University, Columbia University, and several other institutions across the United States and the world. In conclusion, the program featured three complementary components—oral presentations, a facility tour, and a brainstorming session— that together fostered collaboration and high lighted the transformative role of synchrotron based characterization in AM.
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Pan, Shuaihang [Univ. of Utah, Salt Lake City, UT (United States)] (ORCID:000000025312992X), Sprouster, David [Stony Brook Univ., NY (United States)] (ORCID:0000000226890721), Zhang, Xijin [George Mason Univ., Fairfax, VA (United States)] (ORCID:0000000237046198), Wu, Siyu [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000201995471), Bernal Lopez, Miguel Tlahuilcol [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000186022582). 2025-12-08. Advanced Characterization in Advanced Manufacturing Workshop. https://doi.org/10.1080/08940886.2025.2579490
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