Understanding Surface Contamination Effects in Mid-T Baked Cavities

Abstract

Medium-temperature baking is applied to niobium SRF cavities to enhance their quality factor. However, mid-T baking performed in the 300-350 °C range may lead to the formation of surface carbides, which can prevent the cavities from exhibiting the full benefit of mid-T baking. To investigate the effect of potential surface contaminants, the top RF layer of mid-T-baked cavities was removed using an ultralight electropolishing process. The performance of the mid-T baked cavities was significantly improved after applying this ultralight EP. This presentation summarizes the latest results on this study.