DOE OSTI · 3023891
Peering under the surface of semiconductors using scanning tunneling microscopy
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Misra, Shashank [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000170226994), McCowan, Caitlin Victoria [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000209896187), Sheridan, Thomas Robert [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000262474418), Ivie, Jeffrey Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000198428475), Anderson, Evan Michael [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000237713085), Campbell, Quinn [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000313773769), Bussmann, Ezra [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000252852825), Liang, Yunfan [Rensselaer Polytechnic Institute], Zhang, Shengbai [Rensselaer Polytechnic Institute]. 2025-03-01. Peering under the surface of semiconductors using scanning tunneling microscopy. https://doi.org/10.2172/3023891
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