DOE OSTI · 3027431
A Radiation-Aware Model for Analyzing Degradation in Optoelectronic Devices
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Hughes, Eamonn Thomas [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000324286923), Chow, Weng Wah [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Vizkelethy, Gyorgy [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000236522519), Skogen, Erik J. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Fortuna, Seth Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000673355066). 2025-04-01. A Radiation-Aware Model for Analyzing Degradation in Optoelectronic Devices. https://doi.org/10.2172/3027431
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