DOE OSTI · 3362858
Pitfalls in parameters: practical process development in chemical vapor processing of SiC
Abstract
Vapor processing of high-value materials, such as silicon carbide (SiC), is of interest for many industries, including aerospace and energy production. Chemical vapor infiltration (CVI) of additively manufactured components is an especially attractive manufacturing process currently in development. Here, a novel development workflow is demonstrated with the H 2 –CH 3 SiCl 3 gas system for SiC to accelerate the process optimization of CVI SiC. A combination of calculated thermodynamics and high-throughput experimental chemical vapor deposition (CVD) coatings substantially reduced the experiments required with slow CVI processes. The computational results accurately predicted changes in the thermodynamic conditions tested, while CVD coatings – characterized by Raman spectroscopy – addressed changes in kinetic parameters. This workflow is also applicable to other vapor-processing systems, such as pyrolytic carbon, ZrC, or Si 3 N 4 .
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Lamm, Benjamin W. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000340417786), Ramirez, Valencia [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); Georgia Institute of Technology, Atlanta, GA (United States)] (ORCID:0009000502222824), Rogers, Alex [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000177046873), Koyanagi, Takaaki [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000172724049). 2026-03-11. Pitfalls in parameters: practical process development in chemical vapor processing of SiC. https://doi.org/10.1039/d5ta10109c
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