DOE OSTI · 3369092
Data-driven Compact Models for Devices and Circuits: A System Identification Approach for Non-intrusive Reduced Order Modeling of Normal and Radiation Environments in Microelectronics
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Bochev, Pavel B. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000287217119), Hanson, Joshua McKinley [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Paskaleva, Biliana Stefanova [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000259297836), Kuberry, Paul Allen [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000224264591), Musson, Lawrence Cale [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000569965630), Thieme, Ethan Connor [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]. 2025-06-01. Data-driven Compact Models for Devices and Circuits: A System Identification Approach for Non-intrusive Reduced Order Modeling of Normal and Radiation Environments in Microelectronics. https://doi.org/10.2172/3369092
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