Transport Enabled Gates with Integrated Photonics on a Surface-Electrode Ion Trap

Hogle, Craig William [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000531162058); Sterk, Jonathan David [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000280396396); Stick, Daniel Lynn [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000268027539)

doi:10.2172/3374824

DOE OSTI · 3374824

Transport Enabled Gates with Integrated Photonics on a Surface-Electrode Ion Trap

Hogle, Craig William [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000531162058)·Sterk, Jonathan David [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000280396396)·Stick, Daniel Lynn [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000268027539)

View original source ↗Read source document ↗Export metadata ↓

Abstract

The source did not provide an abstract. Follow the original record for more information.

Keep this discovery

Explore connections, maps & timelines

BibTeX RIS

Hogle, Craig William [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000531162058), Sterk, Jonathan David [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000280396396), Stick, Daniel Lynn [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000268027539). 2025-06-01. Transport Enabled Gates with Integrated Photonics on a Surface-Electrode Ion Trap. https://doi.org/10.2172/3374824

Cite the original work for its findings. Save a collection to share your selection of sources.