Super-Resolution Processing of FDTR Measurement Data for Defect Detection

Tencer, John Thomas [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000316255887); Crites, Emily [Cornell University]; Hodges, Wyatt Lea [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000303868908)

doi:10.2172/3378102

DOE OSTI · 3378102

Super-Resolution Processing of FDTR Measurement Data for Defect Detection

Tencer, John Thomas [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000316255887)·Crites, Emily [Cornell University]·Hodges, Wyatt Lea [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000303868908)

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Tencer, John Thomas [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000316255887), Crites, Emily [Cornell University], Hodges, Wyatt Lea [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000303868908). 2025-07-01. Super-Resolution Processing of FDTR Measurement Data for Defect Detection. https://doi.org/10.2172/3378102

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