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DOE OSTI · 3384999

Validation Data for Benchmarking Wire Arc Additive Manufacturing Process Simulations

Abstract

Residual stresses cause geometric distortion and affect mechanical performance of additively manufactured structures, yet they are notoriously difficult to assess and predict. Distortion (warpage) can drive parts outside dimensional tolerance limits, leading to part rejection or rework. For parts that meet tolerance, locked-in residual stress fields can affect structural integrity during operation, particularly subcritical cracking by fatigue, creep, or corrosion. This work develops benchmark data for a common additive manufacturing process (Wire Arc Additive Manufacturing) that can be applied for calibration and validation of physical process models that predict residual stress fields. The work includes design of two different samples of differing geometry, detailed manufacturing records for a set of physical samples, and an extensive set of residual stress measurement data developed using two diverse techniques (the contour method and neutron diffraction). An initial application of the work is also reported, where a modeling challenge was issued to secure residual stress model predictions from two independent laboratories that were blind to residual stress measurement data. These initial blind residual stress predictions show significant discrepancies relative to the measurement data, illustrating the potential value of the underlying validation data. An open repository for this work, including the sample designs, manufacturing process records, and the residual stress data, is also provided for future application in non-blind validation efforts.

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BibTeXRIS

Bachus, Nicholas [Univ. of California, Davis, CA (United States)], Henriksen, Amelia [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies], Hill, Michael [Univ. of California, Davis, CA (United States)], Johnson, Kyle [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies], Nycz, Andrzej [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000174156559), Masuo, Chris [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000341605658), Carter, William [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000203137534), Roy, Sougata [Iowa State Univ., Ames, IA (United States)] (ORCID:0000000329501290), Simunovic, Srdjan [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000177668293), Boyce, Brad L. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies] (ORCID:0000000159941743). 2026-07-09. Validation Data for Benchmarking Wire Arc Additive Manufacturing Process Simulations. https://doi.org/10.1007/s40192-026-00469-y

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36 MATERIALS SCIENCE↗