Highly Accelerated Stress Screening (HASS) of Electronics Assemblies: A Case Study

McClary, Scott Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000190111043); Collins, Elmer W. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]

doi:10.2172/3395500

DOE OSTI · 3395500

Highly Accelerated Stress Screening (HASS) of Electronics Assemblies: A Case Study

McClary, Scott Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000190111043)·Collins, Elmer W. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]

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Abstract

Presentation for Reliability and Maintainability Symposium in January 2026. This is a ROUGH DRAFT that will be blind peer reviewed.

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McClary, Scott Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000190111043), Collins, Elmer W. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]. 2026-01-01. Highly Accelerated Stress Screening (HASS) of Electronics Assemblies: A Case Study. https://doi.org/10.2172/3395500

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