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Determining Surface Terminations and Chirality of Noncentrosymmetric FeGe Thin Films via Scanning Tunneling Microscopy
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Imaging the evolution of lithium-solid electrolyte interface using operando scanning electron microscopy
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Rapid screening of wood and leaf tissues: investigating silicon-based phytoliths in Populus trichocarpa for carbon storage applications using laser-induced breakdown spectroscopy and scanning electron microscopy–energy dispersive X-ray spectroscopy
Phytoliths, which are noncrystalline particles of amorphous silica that form inside plant cells, contribute to the global carbon cycle through their ability to occlude organic carbon.
Scientific exploration with expert knowledge (SEEK) in autonomous scanning probe microscopy with active learning
This work introduces a knowledge-informed framework that integrates human expertise and prior interest into active learning-driven autonomous experimentation, which enhances the exploration efficiency through more targeted experimentation.
Direct Visualization of Metal Sintering and Powder Bed Fusion of 316 Stainless Steel Powders via In Situ Scanning Electron Microscopy
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Twofold symmetry of proximity-induced superconductivity in Bi 2 Te 3 / Bi 2 Sr 2 CaCu 2 O 8 + δ heterostructures revealed by scanning tunneling microscopy
We observe proximity-induced superconductivity in in situ prepared heterostructures constructed by topological insulator Bi 2 Te 3 thin films and high-temperature cuprate superconductors Bi 2 Sr 2 CaCu 2 O 8+δ . The superconducting gap maximum is about 7.6 meV on the surface of Bi 2 Te 3 thin films with a thickness of two quintuple layers, and the gap value decreases with an increase in the film thickness. Moreover, the quasiparticle interference data show clear evidence of a twofold symmetric superconducting gap with gap minima along one pair of the principal crystalline axes of Bi 2 Te 3 . This gap form is consistent with the Δ 4y notation of the topological superconductivity proposed in such systems. Our results provide fruitful information on the possible topological superconductivity induced by the proximity effect in high-temperature superconducting cuprates.
Compressed sensing for scanning tunnel microscopy imaging of defects and disorder
Not Available
Kalman Filter-Based Estimation of Surface Conductivity and Surface Variations in Scanning Tunneling Microscopy
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Particle Distribution Measurement of Pyrotechnic Mixtures using High Resolution Scanning Electron Microscopy (SEM) and Energy Dispersive Spectroscopic (EDS) Imaging
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Peering under the surface of semiconductors using scanning tunneling microscopy
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Investigating Nitrogen Diffusion in Silicon through Scanning Tunneling Microscopy
Presentation for EIPBN (3Beams) focusing on nitrogen diffusion and chemical changes at the surface of silicon. Includes presentation and several backup slides, mostly STM images.
From Electrical Characterization to Surface Contamination: The Role of Electrical-based Scanning Probe Microscopy Techniques
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Exploring the Extremes via In-Situ Scanning Electron Microscopy.
Abstract not provided.
Deterministic creation, characterization, and manipulation of nanostucture-based quantum emitters using scanning probe microscopy techniques
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Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy
Abstract In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably imperfect, introducing aberrations that limit resolution. Modern STEMs overcome this by using hardware aberration correctors comprised of many multipole elements, but these devices are complex, expensive, and can be difficult to tune. We demonstrate a design for an electrostatic phase plate that can act as an aberration corrector. The corrector is comprised of annular segments, each of which is an independent two-terminal device that can apply a constant or ramped phase shift to a portion of the electron beam. We show the improvement in image resolution using an electrostatic corrector. Engineering criteria impose that much of the beam within the probe-forming aperture be blocked by support bars, leading to large probe tails for the corrected probe that sample the specimen beyond the central lobe. We also show how this device can be used to create other STEM beam profiles such as vortex beams and probes with a high degree of phase diversity, which improve information transfer in ptychographic reconstructions.