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An extensive analytical and experimental study SEU in an advanced silicon bipolar process was made. The modeling used process and device parameters to model the SEU charge, collection, and circuit response derived from a special version of PISCES in cylindrical coordinates and SPICE, respectively. Data are reported for test cells of various sizes.
Data for the 9450 I3L bipolar microprocessor and the 80C86 CMOS/epi (vintage 1985) microprocessor are presented, showing single-event soft errors for the full MIL-SPEC temperature range of -55 to 125 C. These data show for the first time that the soft-error cross sections continue to decrease with decreasing temperature at subzero temperatures. The temperature dependence of the two parts, however, is very different.
A chord length distribution function for simultaneus path lengths in two parallelepipeds is developed, which is applicable to a unidirectional flux. The distribution function measures the probability for an ion trajectory to have a path length exceeding a specified value in one parallelepiped and to simultationsly have a path length exceeding another specified value in another parallelepiped.
Tuning maps are an aid in the controller tuning process because they provide a convenient way for the plant operator to determine the consequences of adjusting different controller parameters. In this application the maps provide a graphical representation of the effect of varying the gains in the state feedback matrix on startup and load disturbance transients for a three capacity process. Nominally, the three tank system, represented in diagonal form, has a Proportional-Integral control on each loop. Cross coupling is then introduced between the loops by using non-zero off-diagonal proportional parameters. Changes in transient behavior due to setpoint and load changes are examined by varying the gains of the cross coupling terms.
This paper treats the problem of recovering sustainable nondescending (safe) flight in a transport aircraft after one or more of its control effectors fail. Such recovery can be a challenging goal for many transport aircraft currently in the operational fleet for two reasons. First, they have very little redundancy in their means of generating control forces and moments. These aircraft have, as primary control surfaces, a single rudder and pairwise elevators and aileron/spoiler units that provide yaw, pitch, and roll moments with sufficient bandwidth to be used in stabilizing and maneuvering the airframe. Beyond this, throttling the engines can provide additional moments, but on a much slower time scale. Other aerodynamic surfaces, such as leading and trailing edge flaps, are only intended to be placed in a position and left, and are, hence, very slow-moving. Because of this, loss of a primary control surface strongly degrades the controllability of the vehicle, particularly when the failed effector becomes stuck in a non-neutral position where it exerts a disturbance moment that must be countered by the remaining operating effectors. The second challenge in recovering safe flight is that these vehicles are not agile, nor can they tolerate large accelerations. This is of special importance when, at the outset of the recovery maneuver, the aircraft is flying toward the ground, as is frequently the case when there are major control hardware failures. Recovery of safe flight is examined in this paper in the context of trajectory optimization. For a particular transport aircraft, and a failure scenario inspired by an historical air disaster, recovery scenarios are calculated with and without control surface failures, to bring the aircraft to safe flight from the adverse flight condition that it had assumed, apparently as a result of contact with a vortex from a larger aircraft's wake. An effort has been made to represent relevant airframe dynamics, acceleration limits, and actuator limits faithfully, since these contribute to the lack of agility and control power that plays an important role in defining what can be achieved with the vehicle when it is in extremis.
Abstract-Two types of single event effects - bit errors and single event functional interrupts - were observed during heavy-ion testing of the AD8151 crosspoint switch. Bit errors occurred in bursts with the average number of bits in a burst being dependent on both the ion LET and on the data rate. A pulsed laser was used to identify the locations on the chip where the bit errors and single event functional interrupts occurred. Bit errors originated in the switches, drivers, and output buffers. Single event functional interrupts occurred when the laser was focused on the second rank latch containing the data specifying the state of each switch in the 33x17 matrix.
Combining broad-beam circuit level SEU response with ion microprobe tests on single silicon germanium heterojunction bipolar transistors allows for a better understanding of the charge collection mechanisms responsible for SEU response of HBT technology.
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Heavy ion irradiations have been performed: a) SEU varies little with angle of ion incidence b) MBU depend on the device orientation. The MBU response depends on the well orientation of the device. MRED simulation of an omni-directional GEO environment shows the MBU response to be a combination of response from different orientations. Testing and simulation must account for multiple orientations.
This report describes a modeling and simulation approach for disturbance patterns representative of the environment experienced by a digital system in an electromagnetic reverberation chamber. The disturbance is modeled by a multi-variate statistical distribution based on empirical observations. Extended versions of the Rejection Samping and Inverse Transform Sampling techniques are developed to generate multi-variate random samples of the disturbance. The results show that Inverse Transform Sampling returns samples with higher fidelity relative to the empirical distribution. This work is part of an ongoing effort to develop a resilience assessment methodology for complex safety-critical distributed systems.
We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4 field programmable gate array (FPGA).
This is a NASA Electronics Parts and Packaging (NEPP) independent investigation to determine the single event destructive and transient susceptibility of the Microsemi RTG4 device (DUT).
No abstract available
We present SEU test and analysis of the Microsemi ProASIC3 FPGA. SEU Probability models are incorporated for device evaluation. Included is a comparison to the RTAXS FPGA illustrating the effectiveness of the overall testing methodology.
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Abstract not provided.