Electron microscope technique suggested to reveal microstructures of dispersion-strengthened materials
Electron microscope technique for revealing microstructures of dispersion strengthened materials
Buzek, B. C.↗
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Development of a scanning electron mirror microscope
Scanning electron mirrors microscope design and development
Moll, S. H.↗
Electron microscope study of film nucleation
Nucleation and growth of iron and vanadium thin films to observe polymorphic transformation using electron microscope
Meagher, E. P.↗
Electron microscope study of film nucleation
Crystal structure and growth, and nucleation observed by electron diffraction and microscope in formation of thin metal films during vacuum deposition on carbon
Kronenberg, K. J.↗
Effect of the variation of tip radius on the operation of the field-ion microscope.
Tip radius variation effect on field-ion microscope operation, noting field-temperature characteristics
Weizer, V. G.↗
The atom-probe field ion microscope.
Atom probe field ion microscope combining probe hole FIM and mass spectrometer with single particle sensitivity
Mclane, S. B.↗
Tandem-scanning reflected-light microscope.
Microscope using tandem scanning of reflected light for image contrast and sharpness for semitransparent materials
Egger, M. D.↗
Electron microscope studies of particles on sampling surfaces recovered from space with sounding rockets.
Electron microscope analysis of micrometeoroid particle size distribution on sampling surfaces recovered from space with Luster sounding rockets
Farlow, N. H.↗
Lattice vibrations in silicon - Microscopic dielectric model.
Si lattice vibrations, calculating phonon dispersion curves from microscopic model by dielectric screening theory
Martin, R. M.↗
Olefins of high molecular weight in two microscopic algae.
Olefins of high molecular weight in microscopic algae, discussing hydrocarbon composition investigation by gas chromatography mass spectrometry
Bennett, E. O.↗
An interpretational study of field ion microscope images.
Computerized image simulation to interpret crystal dislocations in field ion microscope images, investigating dislocations in various lattice systems by shell model
Sanwald, R. C.↗
Flexible high-voltage supply for experimental electron microscope
Scanning microscope uses a field-emission tip for the electron source, an electron gun that simultaneously accelerates and focuses electrons from the source, and one auxiliary lens to produce a final probe size at the specimen on the order of angstroms.
Chapman, G. L.↗
Computer experiments on the microscopic behavior of one-dimensional plasmas
Computer experiments on the microscopic behavior of one dimensional electrostatic plasma
Adams, B. H.↗
Energy deposition in microscopic volumes by high-energy protons
Microscopic energy deposition from passing protons in tissue sphere
Baily, N. A.↗
The application of the scanning electron microscope to studies of current multiplication, avalanche breakdown and thermal runaway. Part 1 - General physical basis
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, and thermal runaway - Physical basis
Shaw, D. A.↗
The application of the scanning electron microscope to studies of current multiplication, avalanche breakdown and thermal runaway. Part 2 - General studies, mainly non-thermal
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, and thermal runaway - Nonthermal effects in Read diodes
Sulway, D. V.↗
Radiation damage of ordered vanadium pentacarbide by electron microscope beam bombardment
Radiation damage of vanadium carbide lattice by electron microscope beam bombardment
Lye, R. G.↗
On the resolution and image intensity of the field-ion microscope
High resolution and image intensity of field ion microscope at low temperatures
Forestieri, A. F.↗