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At least 289 records · Page 16

Emerging, Photonic Based Technologies for NASA Space Communications Applications

An objective of NASA's Computing, Information, and Communications Technology program is to support the development of technologies that could potentially lower the cost of the Earth science and space exploration missions, and result in greater scientific returns. NASA-supported photonic activities which will impact space communications will be described. The objective of the RF microphotonic research is to develop a Ka-band receiver that will enable the microwaves detected by an antenna to modulate a 1.55- micron optical carrier. A key element is the high-Q, microphotonic modulator that employs a lithium niobate microdisk. The technical approach could lead to new receivers that utilize ultra-fast, photonic signal processing techniques, and are low cost, compact, low weight and power efficient. The progress in the liquid crystal (LC) beam steering research will also be reported. The predicted benefits of an LC-based device on board a spacecraft include non-mechanical, submicroradian laser-beam pointing, milliradian scanning ranges, and wave-front correction. The potential applications of these emerging technologies to the various NASA missions will be presented.

Pouch, John↗

Electron Microscopy of Natural and Epitaxial Diamond

Semiconducting diamond films have the potential for use as a material in which to build active electronic devices capable of operating at high temperatures or in high radiation environments. Ultimately, it is preferable to use low-defect-density single crystal diamond for device fabrication. We have previously investigated polycrystalline diamond films with transmission electron microscopy (TEM) and scanning electron microscopy (SEM), and homoepitaxial films with SEM-based techniques. This contribution describes some of our most recent observations of the microstructure of natural diamond single crystals and homoepitaxial diamond thin films using TEM.

Posthill, J. B.↗

Pulsed Laser System to Simulate Effects of Cosmic Rays in Semiconductor Devices

Spaceflight system electronic devices must survive a wide range of radiation environments with various particle types including energetic protons, electrons, gamma rays, x-rays, and heavy ions. High-energy charged particles such as heavy ions can pass straight through a semiconductor material and interact with a charge-sensitive region, generating a significant amount of charge (electron-hole pairs) along their tracks. These excess charges can damage the device, and the response can range from temporary perturbations to permanent changes in the state or performance. These phenomena are called single event effects (SEE). Before application in flight systems, electronic parts need to be qualified and tested for performance and radiation sensitivity. Typically, their susceptibility to SEE is tested by exposure to an ion beam from a particle accelerator. At such facilities, the device under test (DUT) is irradiated with large beams so there is no fine resolution to investigate particular regions of sensitivity on the parts. While it is the most reliable approach for radiation qualification, these evaluations are time consuming and costly. There is always a need for new cost-efficient strategies to complement accelerator testing: pulsed lasers provide such a solution. Pulsed laser light can be utilized to simulate heavy ion effects with the advantage of being able to localize the sensitive region of an integrated circuit. Generally, a focused laser beam of approximately picosecond pulse duration is used to generate carrier density in the semiconductor device. During irradiation, the laser pulse is absorbed by the electronic medium with a wavelength selected accordingly by the user, and the laser energy can ionize and simulate SEE as would occur in space. With a tightly focused near infrared (NIR) laser beam, the beam waist of about a micrometer can be achieved, and additional scanning techniques are able to yield submicron resolution. This feature allows mapping of all of the sensitive regions of the studied device with fine resolution, unlike heavy ion experiments. The problematic regions can be precisely identified, and it provides a considerable amount of information about the circuit. In addition, the system allows flexibility for testing the device in different configurations in situ.

Aveline, David C.↗

Charge-coupled device (CCD) television camera for NASA's Galileo mission to Jupiter

The CCD detector under construction for use in the slow-scan television camera for the NASA Galileo Jupiter orbiter to be launched in 1985 is presented. The science objectives and the design constraints imposed by the earth telemetry link, platform residual motion, and the Jovian radiation environment are discussed. Camera optics are inherited from Voyager; filter wavelengths are chosen to enable discrimination of Galilean-satellite surface chemical composition. The CCO design, an 800 by 800-element 'virtual-phase' solid-state silicon image-sensor array with supporting electronics, is described with detailed discussion of the thermally generated dark current, quantum efficiency, signal-to-noise ratio, and resolution. Tests of the effect of ionizing radiation were performed and are analyzed statistically. An imaging mode using a 2-1/3-sec frame time and on-chip summation of the signal in 2 x 2 blocks of adjacent pixels is designed to limit the effects of the most extreme Jovian radiation. Smearing due to spacecraft/target relative velocity and platform instability will be corrected for via an algorithm maximizing spacial resolution at a given signal-to-noise level. The camera is expected to produce 40,000 images of Jupiter and its satellites during the 20-month mission.

Klaasen, K. P.↗

Conical scan impact study. Volume 1: General central data processing facility

The impact of a conical scan versus a linear scan multispectral scanner (MSS) instrument was studied in terms of: (1) design modifications required in framing and continuous image recording devices; and (2) changes in configurations of an all-digital precision image processor. A baseline system was defined to provide the framework for comparison, and included pertinent spacecraft parameters, a conical MSS, a linear MSS, an image recording system, and an all-digital precision processor. Lateral offset pointing of the sensors over a range of plus or minus 20 deg was considered. The study addressed the conical scan impact on geometric, radiometric, and aperture correction of MSS data in terms of hardware and software considerations, system complexity, quality of corrections, throughput, and cost of implementation. It was concluded that: (1) if the MSS data are to be only film recorded, then there is only a nomial concial scan impact on the ground data processing system; and (2) if digital data are to be provided to users on computer compatible tapes in rectilinear format, then there is a significant conical scan impact on the ground data processing system.

Ebert, D. H.↗

TBS (Trabecular Bone Score) Expands Understanding of Spaceflight Effects on the Lumbar Spine of Long Duration Astronauts

Background: Bone loss due to long-duration spaceflight has been characterized by both DXA and QCT serial scans. It is unclear if these spaceflight-induced changes in bone mineral density and structure result in increased fracture incidence. NASA astronauts currently fly on 5-6-month missions on the International Space Station (ISS) and at least one 12-month mission is planned. While NASA has measured areal BMD (by DXA) and volumetric BMD (by QCT), and has estimated hip strength (by finite element models of QCT data, no method has yet been used to examine bone microarchitecture from lumbar spine (LS). DXA scans are routinely performed pre- and post-flight on all ISS astronauts to follow BMD changes associated with space flight. Trabecular Bone Score (TBS) is a relatively new method that measures grey-scale-level texture information extracted from lumbar spine DXA images and correlates with 3D parameters of bone micro-architecture. We evaluated the ability of LS TBS to discriminate changes in astronauts who have flown on ISS missions and to determine if TBS can provide additional information compared to DXA. Methods: LS (L1-4) DXA scans from 51 astronauts (mean age, 47 +/- 4) were divided into 3 groups based on the exercise regimes performed while onboard the ISS. Pre-ARED (exercise using a load-limited resistive exercise device, <300lb), ARED (exercise with a high-load resistive exercise device, up to 600lb) and a Bisphos group (ARED exercise and a 70-mg alendronate tablet once a week before and during flight, starting 17 days before launch). DXA scans were performed and analyzed on a Hologic Discovery W using the same technician for the pre- and postflight scans. LSC for the LS in our laboratory is 0.025 g/cm2. TBS was performed at the Mercy Hospital, Cincinnati, Ohio on a similar Hologic computer. TBS precision was calculated from 16 comparable test subjects (0.0XX g/cm2). Data were preliminary analyzed using a paired, 2-tailed t-test for the difference between pre- and postflight means.

Sibonga, Jean D.↗

Ultraviolet-Infrared Mapping Interferometic Spectrometer

Prism and grating spectrometers have been the defacto devices for spectral mapping and imaging (hereafter referred to as hyperspectra). We have developed a new, hybrid instrument with many superior capabilities, the Digital Array Scanned Interferometer, DASI. The DASI performs the hyperspectral data acquisition in the same way as a grating or prism spectrograph, but retains the substantial advantages of the two-beam (Michelson) interferometer with additional capabilities not possessed by either of the other devices. The DASI is capable of hyperspectral studies in virtually any space or surface environment at any wavelength from below 50 nm to beyond 12 microns with available array detectors. By our efforts, we have defined simple, low cost, no-moving parts DASI's capable of carrying out hyperspectral science measurements for solar system exploration missions, e.g. for martian, asteroid, lunar, or cometary surveys. DASI capabilities can be utilized to minimize cost, weight, power, pointing, and other physical requirements while maximizing the science data return for spectral mapping missions. Our success in the development of DASI's has become and continues to be an important influence on the efforts of the best research groups developing remote sensing instruments for space and other applications.

Source record↗

Disabling CNT Electronic Devices by Use of Electron Beams

Bombardment with tightly focused electron beams has been suggested as a means of electrically disabling selected individual carbon-nanotubes (CNTs) in electronic devices. Evidence in support of the suggestion was obtained in an experiment in which a CNT field-effect transistor was disabled (see figure) by focusing a 1-keV electron beam on a CNT that served as the active channel of a field-effect transistor (FET). Such bombardment could be useful in the manufacture of nonvolatile-memory circuits containing CNT FETs. Ultimately, in order to obtain the best electronic performances in CNT FETs and other electronic devices, it will be necessary to fabricate the devices such that each one contains only a single CNT as an active element. At present, this is difficult because there is no way to grow a single CNT at a specific location and with a specific orientation. Instead, the common practice is to build CNTs into electronic devices by relying on spatial distribution to bridge contacts. This practice results in some devices containing no CNTs and some devices containing more than one CNT. Thus, CNT FETs have statistically distributed electronic characteristics (including switching voltages, gains, and mixtures of metallic and semiconducting CNTs). According to the suggestion, by using a 1-keV electron beam (e.g., a beam from a scanning electron microscope), a particular nanotube could be rendered electrically dysfunctional. This procedure could be repeated as many times as necessary on different CNTs in a device until all of the excess CNTs in the device had been disabled, leaving only one CNT as an active element (e.g., as FET channel). The physical mechanism through which a CNT becomes electrically disabled is not yet understood. On one hand, data in the literature show that electron kinetic energy >86 keV is needed to cause displacement damage in a CNT. On the other hand, inasmuch as a 1-keV beam focused on a small spot (typically a few tens of nanometers wide) deposits a significant amount of energy in a small volume, the energy density may suffice to thermally induce structural and/or electronic changes that disable the CNT. Research may be warranted to investigate this effect in detail.

Petkov, Mihail↗

Automatic weld torch guidance control system

A highly reliable, fully digital, closed circuit television optical, type automatic weld seam tracking control system was developed. This automatic tracking equipment is used to reduce weld tooling costs and increase overall automatic welding reliability. The system utilizes a charge injection device digital camera which as 60,512 inidividual pixels as the light sensing elements. Through conventional scanning means, each pixel in the focal plane is sequentially scanned, the light level signal digitized, and an 8-bit word transmitted to scratch pad memory. From memory, the microprocessor performs an analysis of the digital signal and computes the tracking error. Lastly, the corrective signal is transmitted to a cross seam actuator digital drive motor controller to complete the closed loop, feedback, tracking system. This weld seam tracking control system is capable of a tracking accuracy of + or - 0.2 mm, or better. As configured, the system is applicable to square butt, V-groove, and lap joint weldments.

Smaith, H. E.↗

Nondestructive SEM for surface and subsurface wafer imaging

The scanning electron microscope (SEM) is considered as a tool for both failure analysis as well as device characterization. A survey is made of various operational SEM modes and their applicability to image processing methods on semiconductor devices.

Propst, Roy H.↗

Thermal Remote Anemometer Device

Thermal Remote Anemometer Device developed for remote, noncontacting, passive measurement of thermal properties of sample. Model heated locally by scanning laser beam and cooled by wind in tunnel. Thermal image of model analyzed to deduce pattern of airflow around model. For materials applications, system used for evaluation of thin films and determination of thermal diffusivity and adhesive-layer contact. For medical applications, measures perfusion through skin to characterize blood flow and used to determine viabilities of grafts and to characterize tissues.

Heyman, Joseph S.↗

Exploring Carbon Nanotubes for Nanoscale Devices

Carbon nanotubes (CNTs) are shown to promise great opportunities in nanoelectronic devices and nanoelectromechanical systems (NEMS) because of their inherent nanoscale sizes, intrinsic electric conductivities, and seamless hexagonal network architectures. I present our collaborative work with Stanford on exploring CNTs for nanodevices in this talk. The electrical property measurements suggest that metallic tubes are quantum wires. Furthermore, two and three terminal CNT junctions have been observed experimentally. We have proposed and studied CNT-based molecular switches and logic devices for future digital electronics. We also have studied CNTs based NEMS inclusing gears, cantilevers, and scanning probe microscopy tips. We investigate both chemistry and physics based aspects of the CNT NEMS. Our results suggest that CNT have ideal stiffness, vibrational frequencies, Q-factors, geometry-dependent electric conductivities, and the highest chemical and mechanical stabilities for the NEMS. The use of CNT SPM tips for nanolithography is presented for demonstration of the advantages of the CNT NEMS.

Han, Jie↗

Wavelength-Agile Optical Sensor for Exhaust Plume and Cryogenic Fluid Interrogation

Two optical sensors developed in UW-Madison labs were evaluated for their potential to characterize rocket engine exhaust plumes and liquid oxygen (LOX) fluid properties. The plume sensor is based on wavelength-agile absorption spectroscopy A device called a chirped white pulse emitter (CWPE) is used to generate the wavelength agile light, scanning, for example, 1340 - 1560 nm every microsecond. Properties of the gases in the rocket plume (for example temperature and water mole fraction) can be monitored using these wavelength scans. We have performed preliminary tests in static gas cells, a laboratory GOX/GH2 thrust chamber, and a solid-fuel hybrid thrust chamber, and these initial tests demonstrate the potential of the CWPE for monitoring rocket plumes. The LOX sensor uses an alternative to wavelength agile sensing: two independent, fixed-wavelength lasers are combined into a single fiber. One laser is absorbed by LOX and the other not: by monitoring the differential transmission the LOX concentration in cryogenic feed lines can be inferred. The sensor was successful in interrogating static LOX pools in laboratory tests. Even in ice- and bubble-laden cryogenic fluids, LOX concentrations were measured to better than 1% with a 3 microsec time constant.

Sanders, Scott T.↗

Improved Measurement of Dispersion in an Optical Fiber

An improved method of measuring chromatic dispersion in an optical fiber or other device affords a lower (relative to prior such methods) limit of measurable dispersion. This method is a modified version of the amplitude-modulation (AM) method, which is one of the prior methods. In comparison with the other prior methods, the AM method is less complex. However, the AM method is limited to dispersion levels . 160 ps/nm and cannot be used to measure the symbol of the dispersion. In contrast, the present modified version of the AM method can be used to measure the symbol of the symbol of the dispersion and affords a measurement range from about 2 ps/nm to several thousand ps/nm with a resolution of 0.27 ps/nm or finer. The figure schematically depicts the measurement apparatus. The source of light for the measurement is a laser, the wavelength of which is monitored by an optical spectrum analyzer. A light-component analyzer amplitude-modulates the light with a scanning radio-frequency signal. The modulated light is passed through a buffer (described below) and through the device under test (e.g., an optical fiber, the dispersion of which one seeks to measure), then back to the light-component analyzer for spectrum analysis. Dispersion in the device under test gives rise to phase shifts among the carrier and the upper and lower sideband components of the modulated signal. These phase shifts affect the modulation-frequency component of the output of a photodetector exposed to the signal that emerges from the device under test. One of the effects is that this component goes to zero periodically as the modulation frequency is varied.

Huang, Shouhua↗

Multifrequency Ultra-High Resolution Miniature Scanning Microscope Using Microchannel And Solid-State Sensor Technologies And Method For Scanning Samples

A miniature, ultra-high resolution, and color scanning microscope using microchannel and solid-state technology that does not require focus adjustment. One embodiment includes a source of collimated radiant energy for illuminating a sample, a plurality of narrow angle filters comprising a microchannel structure to permit the passage of only unscattered radiant energy through the microchannels with some portion of the radiant energy entering the microchannels from the sample, a solid-state sensor array attached to the microchannel structure, the microchannels being aligned with an element of the solid-state sensor array, that portion of the radiant energy entering the microchannels parallel to the microchannel walls travels to the sensor element generating an electrical signal from which an image is reconstructed by an external device, and a moving element for movement of the microchannel structure relative to the sample. Discloses a method for scanning samples whereby the sensor array elements trace parallel paths that are arbitrarily close to the parallel paths traced by other elements of the array.

Wang, Yu↗

Range Imaging without Moving Parts

Range-imaging instruments of a type now under development are intended to generate the equivalent of three-dimensional images from measurements of the round-trip times of flight of laser pulses along known directions. These instruments could also provide information on characteristics of targets, including roughnesses and reflectivities of surfaces and optical densities of such semi-solid objects as trees and clouds. Unlike in prior range-imaging instruments based on times of flight along known directions, there would be no moving parts; aiming of the laser beams along the known directions would not be accomplished by mechanical scanning of mirrors, prisms, or other optical components. Instead, aiming would be accomplished by using solid-state devices to switch input and output beams along different fiber-optic paths. Because of the lack of moving parts, these instruments could be extraordinarily reliable, rugged, and long-lasting. An instrument of this type would include an optical transmitter that would send out a laser pulse along a chosen direction to a target. An optical receiver coaligned with the transmitter would measure the temporally varying intensity of laser light reflected from the target to determine the distance and surface characteristics of the target. The transmitter would be a combination of devices for generating precise directional laser illumination. It would include a pulsed laser, the output of which would be coupled into a fiber-optic cable with a fan-out and solid-state optical switches that would enable switching of the laser beam onto one or more optical fibers terminated at known locations in an array on a face at the focal plane of a telescope. The array would be imaged by the telescope onto the target space. The receiver optical system could share the aforementioned telescope with the transmitter or could include a separate telescope aimed in the same direction as that of the transmitting telescope. In either case, light reflected from the target would be focused by the receiver optical system onto an array of optical fibers matching the array in the transmitter. These optical fibers would couple the received light to one or more photodetector( s). Optionally, the receiver could include solid-state optical switches for choosing which optical fiber(s) would couple light to the photodetector(s). This instrument architecture is flexible and can be optimized for a wide variety of applications and levels of performance. For example, it is scalable to any number of pixels and pixel resolutions and is compatible with a variety of ranging and photodetection methodologies, including, for example, ranging by use of modulated (including pulsed and encoded) light signals. The use of fixed arrays of optical fibers to generate controlled illumination patterns would eliminate the mechanical complexity and much of the bulk of optomechanical scanning assemblies. Furthermore, digital control of the selection of the fiber-optic pathways for the transmitted beams could afford capabilities not seen in previous three-dimensional range-imaging systems. Instruments of this type could be specialized for use as, for example, proximity detectors, three-dimensional robotic vision systems, airborne terrain-mapping systems, and inspection systems.

Blair, J. Bryan↗

Surface irregularities detected by flare inspection instrument

Portable fiber optics sensing device which detects surface irregularities in a specific tube flare, permits discrete dimensional measurements to be taken, scanned and read out with only one setup. Capabilities of the instrument can be expanded to include surface inspection of various kinds of tube flares.

Zoike, H. M.↗

Optical scanning tests of complex CMOS microcircuits

The new test method was based on the use of a raster-scanned optical stimulus in combination with special electrical test procedures. The raster-scanned optical stimulus was provided by an optical spot scanner, an instrument that combines a scanning optical microscope with electronic instrumentation to process and display the electric photoresponse signal induced in a device that is being tested.

Levy, M. E.↗