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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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This presentation is an overview of proton cancer therapy facilities in the U.S. Highlights include a status on evaluation for electronics radiation testing.
Two areas of radiation hardened microcircuit infrastructure will be discussed: 1) The availability and performance of radiation hardened microcircuits, and, and 2) The access to radiation test facilities primarily for proton single event effects (SEE) testing. Other areas not discussed, but are a concern include: The challenge for maintaining radiation effects tool access for assurance purposes, and, the access to radiation test facilities primarily for heavy ion single event effects (SEE) testing. Status and implications will be discussed for each area.
This work demonstrates the development and implementation of a Fully Constrained Least Squares (FCLS) unmixing model developed in C++ programming language with OpenCV package and boost C++ libraries in the NASA Earth Exchange (NEX). Visualization of the results is supported by GRASS GIS and statistical analysis is carried in R in a Linux system environment. FCLS was first tested on computer simulated data with Gaussian noise of various signal-to-noise ratio, and Landsat data of an agricultural scenario and an urban environment using a set of global end members of substrate (soils, sediments, rocks, and non-photosynthetic vegetation), vegetation that includes green photosynthetic plants and dark objects which encompasses absorptive substrate materials, clear water, deep shadows, etc. For the agricultural scenario, a spectrally diverse collection of 11 scenes of Level 1 terrain corrected, cloud free Landsat-5 TM data of Fresno, California, USA were unmixed and the results were validated with the corresponding ground data. To study an urbanized landscape, a clear sky Landsat-5 TM data were unmixed and validated with coincident World View-2 abundance maps (of 2 m spatial resolution) for an area of San Francisco, California, USA. The results were evaluated using descriptive statistics, correlation coefficient, RMSE, probability of success, boxplot and bivariate distribution function. Finally, FCLS was used for sub-pixel land cover analysis of the monthly WELD (Wen-enabled Landsat data) repository from 2008 to 2011 of North America. The abundance maps in conjunction with DMSP-OLS nighttime lights data were used to extract the urban land cover features and analyze their spatial-temporal growth.
This presentation will review some past NASA presentations that had identified challenges and future trends in the assurance of Electrical, Electronic and Electromechanical (EEE) parts for spaceflight applications. It will contrast the concerns expressed in those presentations with the challenges of today and identify trends that give insight into the future. Common themes include the use of commercial parts, limited technical and physical resources, the pace of technology change and the difficulties in handling and testing individual parts as they become smaller and more complex. Some options for dealing with these challenges will be suggested to accommodate increasing numbers of smallsats, cubesats, constellations and other disruptive concepts, as space becomes more and more commercialized.
This presentation will discuss the considerations an engineer should take to perform Single Event Effects (SEE) testing on GPU devices. Notable topics will include setup complexity, architecture insight which permits cross platform normalization, acquiring a reasonable detail of information from the test suite, and a few lessons learned from preliminary testing.
When performing a single event effect (SEE) test during a test campaign, flexibility and out of the box thinking is often required for unexpected and unplanned events.
The aerospace and semiconductor industries lost 2000 hours annually of research access when IUCF closed. An ad hoc team between the U.S. government and industry was formed to evaluate other facility options. In this presentation, we will discuss: 1) Why aerospace, semiconductor manufacturers, and others are interested in proton facility access, as well as, 2) Some of the basics of a typical test for electronics, and 3) We'll conclude with the brief current status on progress.
The aerospace and semiconductor industries lost approximately 2000 hours annually of research access when IUCF closed. An ad hoc team between the U.S. government and industry was formed to evaluate other facility options. In this presentation, we will discuss: 1) Why aerospace, semiconductor manufacturers, and others are interested in proton facility access, as well as, 2) Some of the basics of a typical tests for electronics, and 3) We'll conclude with the brief current status on progress.
This presentation will cover NASA Electrical, Electronic, and Electromechanical (EEE) Parts Landscape and 2018 Activities.
The aerospace and semiconductor industries lost approx. 2000 hours annually of research access when IUCF closed. An ad hoc team between the U.S. government and industry was formed to evaluate other facility options. In this presentation, we will discuss: 1) Why aerospace, semiconductor manufacturers, and others are interested in proton facility access, as well as, 2) Some of the basics of a typical test for electronics, and 3) We"ll conclude with the brief current status on progress.
A standardized test method has been created to characterize and stress graphics processing units (GPU) during radiation effects testing.
This presentation will include information about Graphics Processing Unit (GPU) technology, NASA Electronic Parts and Packaging (NEPP) tasks and their purpose, collaborations, a roadmap, NEPP partners, results to date, and future plans.
This presentation will include information about Double Data Rate (DDR) technology, NASA Electronic Parts and Packaging (NEPP) tasks and their purpose, collaborations, a roadmap, NEPP partners, results to date, and future plans.
While some Graphical Processing Units (GPUs) are discrete components (i.e.GTX1050), others take the form of an IP block or embedded engine within a System on Chip (SoC) device such as the Qualcomm Snapdragon"TM" 820 which contains a Qualcomm Adreno"TM" 530 GPU. Within this device are various functional blocks which can be exercised with software payloads. NVidia's Jetson"TM" TX1 SoC is provided on a System on Module (SOM). Within it are Central Processing Unit (CPU) cores and an nVidia GPU which can be accessed similarly to a discrete GPU coprocessor. While the packaging is different, each one of these GPUs needs to be tested using the same standardized code.
Graphics Processing Units (GPU) have emerged as a proven technology that enables high performance computing and parallel processing in a small form factor. GPUs enhance the traditional computer paradigm by permitting acceleration of complex mathematics and providing the capability to perform weighted calculations, such as those in artificial intelligence systems. Despite the performance enhancements provided by this type of microprocessor, there exist tradeoffs in regards to reliability and radiation susceptibility, which may impact mission success. This report provides an insight into GPU architecture and its potential applications in space and other similar markets. It also discusses reliability, qualification, and radiation considerations for testing GPUs.
The purpose of this testing is to characterize the ISSI IS46DR16640B-25DBA25 parameter degradation for total dose response. This test’s purpose is to evaluate and compare lot date codes for sensitivity. In the test, the device is exposed to both low dose and high dose rate (HDR) irradiations using gamma radiation. Device parameters such as leakage currents, quantity of upset bits or addresses, and overall chip and die health are investigated to determine which lot is more robust. These parameters directly affect the functionality of the memory within a system and may determine thresholds necessary to mitigate failure.
We are investigating the application of classical reliability performance metrics combined with standard single event upset (SEU) analysis data to improve system survivability prediction.
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