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NASA NTRS2010

Wavefront Sensing of X-Ray Telescopes

Phase Retrieval analysis of off-axis or defocused focal-plane data from telescope optics has been proven effective in understanding misalignments and optical aberrations in normal incidence telescopes. The approach is used, e.g., in commissioning of the James Webb Space Telescope (JWST) segmented primary mirror. There is a similar need for evaluating low-order figure errors of grazing incidence mirrors and nested telescope assemblies. When implemented in these systems, phase retrieval does not depend on normal incidence access to each mirror (shell) surface and, therefore, provides an effective means for evaluating nested x-ray telescopes during integration and test. We have applied a well-known phase retrieval algorithm to grazing incidence telescopes. The algorithm uses the Levenberg-Marquardt optimization procedure to perform a non-linear least-squares fit of the telescope Point Spread Function (PSF). The algorithm can also retrieve low order figure errors at visible wavelengths where optical diffraction is the dominant defect in the PSF. In this paper we will present the analytical approach and its implementation for grazing incidence mirrors of the International X-Ray Observatory (IXO). We analyze the effects of low order axial surface errors individually, and in combination on the system PSF at 633 nanometers. We demonstrate via modeling that the wavefront sensing algorithm can recover axial errors (of the grazing incidence mirrors) to a small fraction of the known axial figure errors using simulated PSFs as input data to the algorithm.

Saha, Timo↗

NASA NTRS1985

Test method for telescopes using a point source at a finite distance

A test method for telescopes that makes use of a focused ring formed by an annular aperture when using a point source at a finite distance is evaluated theoretically and experimentally. The results show that the concept can be applied to near-normal, as well as grazing incidence. It is particularly suited for X-ray telescopes because of their intrinsically narrow annular apertures, and because of the largely reduced diffraction effects.

Griner, D. B.↗

NASA NTRS2000

Optical Performance Modeling of FUSE Telescope Mirror

We describe the Metrology Data Processor (METDAT), the Optical Surface Analysis Code (OSAC), and their application to the image evaluation of the Far Ultraviolet Spectroscopic Explorer (FUSE) mirrors. The FUSE instrument - designed and developed by the Johns Hopkins University and launched in June 1999 is an astrophysics satellite which provides high resolution spectra (lambda/Delta(lambda) = 20,000 - 25,000) in the wavelength region from 90.5 to 118.7 nm The FUSE instrument is comprised of four co-aligned, normal incidence, off-axis parabolic mirrors, four Rowland circle spectrograph channels with holographic gratings, and delay line microchannel plate detectors. The OSAC code provides a comprehensive analysis of optical system performance, including the effects of optical surface misalignments, low spatial frequency deformations described by discrete polynomial terms, mid- and high-spatial frequency deformations (surface roughness), and diffraction due to the finite size of the aperture. Both normal incidence (traditionally infrared, visible, and near ultraviolet mirror systems) and grazing incidence (x-ray mirror systems) systems can be analyzed. The code also properly accounts for reflectance losses on the mirror surfaces. Low frequency surface errors are described in OSAC by using Zernike polynomials for normal incidence mirrors and Legendre-Fourier polynomials for grazing incidence mirrors. The scatter analysis of the mirror is based on scalar scatter theory. The program accepts simple autocovariance (ACV) function models or power spectral density (PSD) models derived from mirror surface metrology data as input to the scatter calculation. The end product of the program is a user-defined pixel array containing the system Point Spread Function (PSF). The METDAT routine is used in conjunction with the OSAC program. This code reads in laboratory metrology data in a normalized format. The code then fits the data using Zernike polynomials for normal incidence systems or Legendre-Fourier polynomials for grazing incidence systems. It removes low order terms from the metrology data, calculates statistical ACV or PSD functions, and fits these data to OSAC models for the scatter analysis. In this paper we briefly describe the laboratory image testing of FUSE spare mirror performed in the near and vacuum ultraviolet at John Hopkins University and OSAC modeling of the test setup performed at NASA/GSFC. The test setup is a double-pass configuration consisting of a Hg discharge source, the FUSE off-axis parabolic mirror under test, an autocollimating flat mirror, and a tomographic imaging detector. Two additional, small fold flats are used in the optical train to accommodate the light source and the detector. The modeling is based on Zernike fitting and PSD analysis of surface metrology data measured by both the mirror vendor (Tinsley) and JHU. The results of our models agree well with the laboratory imaging data, thus validating our theoretical model. Finally, we predict the imaging performance of FUSE mirrors in their flight configuration at far-ultraviolet wavelengths.

Saha, Timo T.↗

NASA NTRS1988

Transmission grating spectroscopy and the Advanced X-ray Astrophysics Facility (AXAF)

The use of transmission gratings with grazing-incidence telescopes in celestial X-ray astrononmy is reviewed. The basic properties of transmission grating spectrometers and the use of 'phased' gratings to enhance the diffraction efficiency are outlined. The fabrication of the gratings is examined, giving special attention to the AXAF High Energy Transmission Grating. The performance of finite-period thick gratings is briefly discussed, and the performance of the transmission grating spectrometers planned for SPECTROSAT and AXAF are examined.

Schattenburg, M. L.↗

NASA NTRS2000

Interferometry in the Extreme Ultraviolet and X-Ray

We report on demonstration of an x-ray interferometer that uses plane mirrors at grazing incidence to create interference fringes in the extreme ultraviolet and soft x-ray portions of the spectrum. X-ray interferometry has historically been implemented through narrow band, diffractive systems that split the wavefront. Our system, by using two separate optical channels to create interference from two areas of the wavefront, has broad band response and much higher efficiency. We discuss some applications of this technique to astronomy and microscopy including the possibility of eventually capturing a micro-arcsecond image of a black hole.

Cash, W.↗

NASA NTRS2000

Metrology and Alignment of Light Weight Grazing Incidence X-Ray Mirrors

Metrology and alignment of light weight X-ray optics have been a challenge for two reasons: (1) that the intrinsic mirror quality and distortions caused by handling can not be easily separated, and (2) the diffraction limits of the visible light become a severe problem at the order of one arc-minute. Traditional methods of using a normal incident pencil or small parallel beam which monitors a tiny fraction of the mirror in question at a given time can not adequately monitor those distortions. We are developing a normal incidence setup that monitors a large fraction, if not the whole, of the mirror at any given time. It will allow us to align thin X-ray mirrors to-an accuracy of a few arc seconds or to a limit dominated by the mirror intrinsic quality.

Zhang, William↗

NASA NTRS1999

Development of a Grazing Incidence X-Ray Interferometer

A grazing incidence x-ray interferometer design capable of micro-arcsecond level resolution is discussed. This practical design employs a Michelson Stellar interferometer approach to create x-ray interference fringes without the use of Wolter style optics or diffraction crystals. Design solutions accommodating alignment, vibration, and thermal constraints are reviewed. We present the development and demonstration of a working experiment along with tolerance studies, data analysis, and results.

Shipley, Ann↗

NASA NTRS1984

Measuring EUV Line Emission from the Hot Interstellar Medium

In the local interstellar medium, the presence of hot gas was inferred from measurements of oxygen VI absorption in the ultraviolet, and from diffuse emission in the extreme ultraviolet (EUV) and soft X-ray regions. A spectrometer that is very sensitive to gas in this temperature range is described. The spectrometer uses an array of plane ruled gratings at grazing incidence in the extreme off plane mount. A set of Kirkpatrick-Baez mirrors focuses the conically diffracted light on to one of two microchannel plate detectors. The field of view of the instrument is 0.2 deg by 12 deg. The predicted sensitivity ranges from 50 to 200 ph/(sq cm sec str) with a resolving power of 15 to 50 over the 50 to 700 angstrom wavelength band.

Labov, S.↗

NASA NTRS1986

The soft X-ray/EUV calibration facility at the University of Colorado

The components of the calibration facility at the University of Colorado are described. The system is capable of analyzing the performance of optical components in the wavelength range from 2.7 to 2500 A. The system uses two light sources: a water-cooled hollow cathode gas discharge source and a soft X-ray source. The 2.2-m grazing incidence monochrometer, slits, large chamber, and computer-controlled manipulator are examined. The NBS aluminum oxide photodiode, a flowing gas proportional counter, and an imaging microchannel plate device are employed to detect the light. The optics, detectors, and data acquisition system are computer controlled. The facility is applicable for evaluating the performance of diffraction gratings, multilayer mirrors, reflective coatings, spectrographs, surface roughness scattering, and absolute detector efficiencies. Examples demonstrating the capabilities of the facility and a diagram of the facility are presented.

Windt, David L.↗

DOE OSTI2026

Thin Film Synthesis of SrZn2P2 with SrI2 Post-Annealing for Enhanced Crystallinity and Optoelectronic Quality

Ternary Zintl phosphides are promising light-absorbing semiconductors for thin-film optoelectronic applications, but strategies for controlling their microstructure and optoelectronic quality remain underexplored. Here, we report the synthesis of phase-pure SrZn2P2 thin films using radio-frequency co-sputtering in a PH3 + Ar atmosphere and investigate the impact of post-growth processing on their structural and optical properties. Grazing-incidence X-ray scattering and Raman spectroscopy confirm the formation of crystalline SrZn2P2 films over a finite compositional window. Optical measurements reveal clear absorption near the direct-band-gap energy (~1.8 eV) and near-band-edge photoluminescence. Further, we have studied the effects of chemically compatible halide-assisted annealing. It is found that SrI2 treatments lead to pronounced grain growth and reduced diffraction peak broadening while preserving phase purity, in contrast to rapid thermal or forming-gas annealing. Notably, annealing with SrI2 at 450 degrees C significantly enhances both the intensity and spatial uniformity of the photoluminescence, thus connecting the observed microstructural consolidation with improved radiative recombination. Our study demonstrates that halide-assisted annealing provides an effective pathway for microstructural control in SrZn2P2 thin films and highlights a generalizable processing strategy for advancing Zintl phosphide semiconductors toward optoelectronic applications.

14 SOLAR ENERGY↗

NASA NTRS1983

X-ray spectrographs using radial groove gratings

A high efficiency spectrograph design for the EUV and soft X rays is presented. This grazing incidence system uses a plane surface reflection grating with rulings that are radial, like the spokes of a wheel. The grating is placed in a beam of light that is converging to a focus. The single reflection off the grating is in the conical diffraction mount ensuring maximum performance from the system. Aberrations and performance levels are discussed. The gratings can be manufactured with existing ruling engines. Sample applications to an X-ray monochromator and an EUV stellar spectrograph are discussed.

Cash, W. C., Jr.↗

NASA NTRS2009

X-ray Interferometry with Transmissive Beam Combiners for Ultra-High Angular Resolution Astronomy

Abstract Interferometry provides one of the possible routes to ultra-high angular resolution for X-ray and gamma-ray astronomy. Sub-micro-arc-second angular resolution, necessary to achieve objectives such as imaging the regions around the event horizon of a super-massive black hole at the center of an active galaxy, can be achieved if beams from parts of the incoming wavefront separated by 100s of meters can be stably and accurately brought together at small angles. One way of achieving this is by using grazing incidence mirrors. We here investigate an alternative approach in which the beams are recombined by optical elements working in transmission. It is shown that the use of diffractive elements is a particularly attractive option. We report experimental results from a simple 2-beam interferometer using a low-cost commercially available profiled film as the diffractive elements. A rotationally symmetric filled (or mostly filled) aperture variant of such an interferometer, equivalent to an X-ray axicon, is shown to offer a much wider bandpass than either a Phase Fresnel Lens (PFL) or a PFL with a refractive lens in an achromatic pair. Simulations of an example system are presented.

Skinner, G. K.↗

NASA NTRS1987

X-ray optics - A technique for high resolution imaging

Both scattering and figure errors in grazing incidence optics are larger in the plane of incidence than out-of-plane by a factor equal to 1/sin theta, where theta is the graze angle. When the full annular aperture of a grazing incidence telescope is stopped down, the point spread function becomes highly elliptical with a width as much as sin theta times narrower than the full image. In practice, this means that improvements in resolution of up to 100 times can be achieved, and effective resolution can approach the diffraction limit. Laboratory data demonstrating the effect are presented.

Cash, Webster↗

NASA NTRS2009

Fabricating Radial Groove Gratings Using Projection Photolithography

Projection photolithography has been used as a fabrication method for radial grove gratings. Use of photolithographic method for diffraction grating fabrication represents the most significant breakthrough in grating technology in the last 60 years, since the introduction of holographic written gratings. Unlike traditional methods utilized for grating fabrication, this method has the advantage of producing complex diffractive groove contours that can be designed at pixel-by-pixel level, with pixel size currently at the level of 45 45 nm. Typical placement accuracy of the grating pixels is 10 nm over 30 nm. It is far superior to holographic, mechanically ruled or direct e-beam written gratings and results in high spatial coherence and low spectral cross-talk. Due to the smooth surface produced by reactive ion etch, such gratings have a low level of randomly scattered light. Also, due to high fidelity and good surface roughness, this method is ideally suited for fabrication of radial groove gratings. The projection mask is created using a laser writer. A single crystal silicon wafer is coated with photoresist, and then the projection mask, with its layer of photoresist, is exposed for patterning in a stepper or scanner. To develop the photoresist, the fabricator either removes the exposed areas (positive resist) of the unexposed areas (negative resist). Next, the patterned and developed photoresist silicon substrate is subjected to reactive ion etching. After this step, the substrate is cleaned. The projection mask is fabricated according to electronic design files that may be generated in GDS file format using any suitable CAD (computer-aided design) or other software program. Radial groove gratings in off-axis grazing angle of incidence mount are of special interest for x-ray spectroscopy, as they allow achieving higher spectral resolution for the same grating area and have lower alignment tolerances than traditional in-plane grating scheme. This is especially critical for NASA Constellation- X project that will utilize hundreds of gratings all of which need to be precisely aligned for x-ray observation of space.

Iazikov, Dmitri↗

DOE OSTI2025

Structural stability, elemental ordering, and transport properties of layered ScTaN 2

Ternary transition metal (TM) nitrides have gained significant attention in thin film research due to their promising properties for a broad range of applications. Particularly, some of the ternary TM nitrides have been predicted to adopt layered structures that make them interesting for thermoelectric conversion and quantum materials applications. Unfortunately, synthesis of TM ternary nitride films by physical vapor deposition often favors disordered 3D structures rather than the predicted 2D-like layered structure. In this study, we investigate the structural interplay in the Sc-Ta-N ternary system using a combinatorial approach. Combinatorial libraries S⁢c 𝑥 ⁢T⁢a 1−𝑥 ⁢N are synthesized following a two-step method: First, deposit film precursors by cosputtering and then process the resulting 3D-structured samples with rapid thermal annealing. Synchrotron grazing-incidence wide-angle x-ray scattering on films annealed at 1200 ⁢°⁢C for 20 min leads to the nucleation of ScTaN 2 layered structure (𝑃⁢6 3 /𝑚⁢𝑚⁢𝑐) near stoichiometry. We find that the layered structure can accommodate large off-stoichiometry in the Ta-rich region (𝑥 < 0.5), facilitated by the alloying with quasi-isostructural Ta 5 ⁢N 6 compound that exists on a composition tie line at 𝑥 = 0. While focusing on ScTaN 2 , we estimate the long-range order parameter in near-stoichiometric films to be 0.86, corresponding to a fraction of Sc/Ta antisites of 7%. Transport measurements on ScTaN 2 reveal a nearly temperature-independent high carrier density (10 21 c⁢m −3 ), suggesting a heavily doped semiconductor or semimetallic character, consistent with a small positive Seebeck coefficient of +19 µV/K. The carrier mobility at 2 K is relatively small (9.5c⁢m 2 V −1 s −1 ) and the residual-resistivity ratio is minor, suggesting that electrical conduction is dominated by defects or disorder. Measured magnetoresistance suggests possible weak antilocalization at 2 K. This paper highlights the interplay between ScTaN 2 and Ta 5 ⁢N 6 crystal structures in stabilizing layered materials, emphasizes the importance of cation order/disorder for potential tunable alloys, and suggests that ScTaN 2 is a promising platform for exploring electronic properties.

36 MATERIALS SCIENCE↗

NASA NTRS1982

Echelle spectrographs at grazing incidence

It is shown that by using the conical diffraction mount, existing echelle gratings can be used at grazing incidence to achieve high spectral resolution in the extreme UV and soft X rays. Design considerations for grazing incidence echelle spectrographs are examined, and two sample designs are discussed. The first, for use in the extreme UV, has a primary mirror and an entrance slit to the spectrograph. The system has a resolution of 10,000, operates at any wavelength longward of 100 A, and covers 30% of the spectrum at a single setting. The X-ray spectrograph uses objective gratings to obtain spectral resolution of 28,000 over any factor of 2 in. wavelength. It operates to wavelengths as short as 4 A.

Cash, W.↗

NASA NTRS1983

High efficiency spectrographs for the EUV and soft X-rays

The use of grazing incidence optics and reflection grating designs is shown to be a method that improves the performance of spectrographs at wavelengths shorter than 1200 A. Emphasis is laid on spectroscopic designs for X ray and EUV astronomy, with sample designs for an objective reflection grating spectrograph (ORGS) and an echelle spectrograph for wavelengths longer than 100 A. Conical diffraction allows operations at grazing incidence in the echelle spectrograph. In ORGS, the extreme distance of X ray objects aids in collimating the source radiation, which encounters conical diffraction within the instrument, proceeds parallel to the optical axis, and arrives at the detector. A series of gratings is used to achieve the effect. A grazing echelle is employed for EUV observations, and offers a resolution of 20,000 over a 300 A bandpass.

Cash, W.↗

NASA NTRS1986

Grazing incidence optics; Proceedings of the Meeting, Orlando, FL, Apr. 3, 4, 1986

Papers are presented on the diffraction-limited performance of grazing incidence optical systems; transverse ray aberrations of Wolter type 1 telescopes; hybrid X-ray telescope systems; surface characterization of grazing incidence optics in the extreme UV and X-ray regions; and the surface roughness properties of synchrotron radiation optics. Topics discussed include the simulation of free-abrasive grinding of grazing incidence mirrors with vertical-honing and flexible blades; mirrors for the Extreme Ultraviolet Explorer; the design and development of conical X-ray imaging mirrors; thermal loading considerations for synchrotron radiation mirrors; and grazing incidence optics for synchrotron radiation insertion-device beams. Consideration is given to the interpretation of glancing incidence scattering measurements; damage processes in short wavelength coated FEL optics; the replication of grain incidence optics; and the assembly and alignment of the Technology Mirror Assembly.

Osantowski, John F.↗