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Results for “Reliability Testing”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS1988

Integrated circuit reliability testing

A technique is described for use in determining the reliability of microscopic conductors deposited on an uneven surface of an integrated circuit device. A wafer containing integrated circuit chips is formed with a test area having regions of different heights. At the time the conductors are formed on the chip areas of the wafer, an elongated serpentine assay conductor is deposited on the test area so the assay conductor extends over multiple steps between regions of different heights. Also, a first test conductor is deposited in the test area upon a uniform region of first height, and a second test conductor is deposited in the test area upon a uniform region of second height. The occurrence of high resistances at the steps between regions of different height is indicated by deriving the measured length of the serpentine conductor using the resistance measured between the ends of the serpentine conductor, and comparing that to the design length of the serpentine conductor. The percentage by which the measured length exceeds the design length, at which the integrated circuit will be discarded, depends on the required reliability of the integrated circuit.

Buehler, Martin G.↗
NASA NTRS1990

Integrated circuit reliability testing

A technique is described for use in determining the reliability of microscopic conductors deposited on an uneven surface of an integrated circuit device. A wafer containing integrated circuit chips is formed with a test area having regions of different heights. At the time the conductors are formed on the chip areas of the wafer, an elongated serpentine assay conductor is deposited on the test area so the assay conductor extends over multiple steps between regions of different heights. Also, a first test conductor is deposited in the test area upon a uniform region of first height, and a second test conductor is deposited in the test area upon a uniform region of second height. The occurrence of high resistances at the steps between regions of different height is indicated by deriving the measured length of the serpentine conductor using the resistance measured between the ends of the serpentine conductor, and comparing that to the design length of the serpentine conductor. The percentage by which the measured length exceeds the design length, at which the integrated circuit will be discarded, depends on the required reliability of the integrated circuit.

Buehler, Martin G.↗
NASA NTRS1994

Component Reliability Testing of Long-Life Sorption Cryocoolers

This paper summarizes ongoing experiments characterizing the ability of critical sorption cryocooler components to achieve highly reliable operation for long-life space missions. Test data obtained over the past several years at JPL are entirely consistent with achieving ten year life for sorption compressors, electrical heaters, container materials, valves, and various sorbent materials suitable for driving 8 to 180 K refrigeration stages. Test results for various compressor systems are reported. Planned future tests necessary to gain a detailed understanding of the sensitivity of cooler performance and component life to operating constraints, design configurations, and fabrication, assembly and handling techniques, are also discussed.

operating constraints fabrication design testing↗
NASA NTRS1985

Light-induced effects-impacts to module performance measurements and reliability testing: An overview

The stability of solar cells is a key factor in determining the reliability of photovoltaic modules and is of great interest in the case of solar cells having a new technology which has not yet been fully developed. In particular this question arises with hydrogenated amorphous silicon (a-Si) solar cells because a-Si exhibits reversible light induced changes in its electronic properties, commonly referred to as the Staebler-Wronski effect (SWE). Continuous progress is being made in the peak conversion efficiencies of a-Si solar cells and efficiencies in excess of 11% have been achieved. However, stability is still a problem. ARCO Solar reports results on solar cells which, after over a year's exposure to sunlight, under open circuit conditions, still have about 7% conversion efficiency. Other results show a region of fast degradation for about a month, after which the degradation diminishes rapidly.

Wronski, C. R.↗
NASA NTRS2002

Reliability Testing of NASA Piezocomposite Actuators

NASA Langley Research Center has developed a low-cost piezocomposite actuator which has application for controlling vibrations in large inflatable smart space structures, space telescopes, and high performance aircraft. Tests show the NASA piezocomposite device is capable of producing large, directional, in-plane strains on the order of 2000 parts-per-million peak-to-peak, with no reduction in free-strain performance to 100 million electrical cycles. This paper describes methods, measurements, and preliminary results from our reliability evaluation of the device under externally applied mechanical loads and at various operational temperatures. Tests performed to date show no net reductions in actuation amplitude while the device was moderately loaded through 10 million electrical cycles. Tests were performed at both room temperature and at the maximum operational temperature of the epoxy resin system used in manufacture of the device. Initial indications are that actuator reliability is excellent, with no actuator failures or large net reduction in actuator performance.

Wilkie, W.↗
NASA NTRS1981

Development of an accelerated reliability test schedule for terrestrial solar cells

An accelerated test schedule using a minimum amount of tests and a minimum number of cells has been developed on the basis of stress test results obtained from more than 1500 cells of seven different cell types. The proposed tests, which include bias-temperature, bias-temperature-humidity, power cycle, thermal cycle, and thermal shock tests, use as little as 10 and up to 25 cells, depending on the test type.

Lathrop, J. W.↗
NASA NTRS1986

Solar cell reliability testing

The progress and initial data on accelerated stress tests on small amorphous silicon test samples from several manufacturers are reported. The test samples include both single and tandem junction devices.

Lathrop, J.↗
NASA NTRSDate not supplied

Reliability Test of the Actively Tunable Filter

The middle-wavelength infrared (MWIR) waveband is considered the “spectral fingerprint”for many chemical species. MWIR: 3 –10 μm wavelength range. MWIR imaging devices are important for multispectral imaging, thermography, chemical spectroscopy, surveillance, automotive safety, and astronomy. Tunable optical properties are desired to increase the amount of information that is detectable. Ge2Sb2Te5(GST) is a chalcogenide phase change material (PCM) that has the potential to be used as a compact, solid-state, fast-switching tunable optical filter.

Tunable filter↗
NASA NTRSDate not supplied

Reliability Growth Modeling and Testing

Reliability growth has been modelled as an exponential decline in the cumulative failure rate that continues indefinitely as long as testing continues. Contrary to this, most reliability growth data show a brief high initial failure rate due to infant mortality followed by a long period of constant low failure rate. A two part failure rate model with an initial exponential decline followed by a constant failure rate usually fits the data and provides a more realistic description of reliability growth. The reliability growth process consists of testing, experiencing failures, finding the failure causes, and redesigning the system to remove them. The cost of reliability growth increases with the number of inherent failure modes and the time needed for them to occur and be removed. The failure modes with the lower failure rates will tend to occur later, as their Mean Time Before Failure (MTBF) is the inverse of the failure rate. Reliability growth testing has diminishing returns, since it takes longer to find and remove the less probable failures.This paper first discusses the reliability bathtub curve and then explains that reliability growth is produced by testing, identifying failure causes, and designing to remove them. A simple model of reliability growth is introduced, with a brief group of early failures followed by a constant failure rate. The cumulative failure rate n(t)/t can decline as rapidly as1/t or t-1butdeclines more slowly if additiona lfailures occur. The 56-failure Crow data seti s used to demonstrate the two-phase model of reliability growth followed by a constant failure rate. 13 additional data sets are modeled, with 9 of the 14 data sets showing reliability growth approximately as n(t)/t =1/t or t-1and substantial final failure rates. The model fits most of the data sets, but 4of the 14 show no reliability growth. The reliability growth period typically includes six failures and extends one-quarter or half the total test time. As reliability growth testing continues, the cumulative failure rate should be tracked to estimate the reliability growth exponent and the final failure rate.

reliability growth modeling↗