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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS1993

Health maintenance facility system effectiveness testing

The Medical Simulations Working Group conducted a series of medical simulations to evaluate the proposed Health Maintenance Facility (HMF) Preliminary Design Review (PDR) configuration. The goal of these simulations was to test the system effectiveness of the HMF PDR configurations. The objectives of the medical simulations are to (1) ensure fulfillment of requirements with this HMF design, (2) demonstrate the conformance of the system to human engineering design criteria, and (3) determine whether undesirable design or procedural features were introduced into the design. The simulations consisted of performing 6 different medical scenarios with the HMF mockup in the KRUG laboratory. The scenarios included representative medical procedures and used a broad spectrum of HMF equipment and supplies. Scripts were written and simulations performed by medical simulations working group members under observation from others. Data were collected by means of questionnaires, debriefings, and videotapes. Results were extracted and listed in the individual reports. Specific issues and recommendations from each simulation were compiled into the individual reports. General issues regarding the PDR design of the HMF are outlined in the summary report.

Lloyd, Charles W.↗
NASA NTRS1975

Results of a jet plume effects test on Rockwell International integrated space shuttle vehicle using a vehicle 5 configuration 0.02-scale model (88-OTS) in the 11 by 11 foot leg of the NASA/Ames Research Center unitary plan wind tunnel (IA19), volume 1

Results are presented of jet plume effects test IA19 using a vehicle 5 configuration integrated space shuttle vehicle 0.02-scale model in the NASA/Ames Research Center 11 x 11-foot leg of the unitary plan wind tunnel. The jet plume power effects on the integrated vehicle static pressure distribution were determined along with elevon, main propulsion system nozzle, and solid rocket booster nozzle effectiveness and elevon hinge moments.

Nichols, M. E.↗
NASA NTRS2017

Single Event Effect Testing of the Analog Devices ADV212

The Analog Devices ADV212 was initially tested for single event effects (SEE) at the Texas AM University Cyclotron Facility (TAMU) in July of 2013. Testing revealed a sensitivity to device hang-ups classified as single event functional interrupts (SEFI), soft data errors classified as single event upsets (SEU), and, of particular concern, single event latch-ups (SEL). All error types occurred so frequently as to make accurate measurements of the exposure time, and thus total particle fluence, challenging. To mitigate some of the risk posed by single event latch-ups, circuitry was added to the electrical design to detect a high current event and automatically recycle power and reboot the device. An additional heavy-ion test was scheduled to validate the operation of the recovery circuitry and the continuing functionality of the ADV212 after a substantial number of latch-up events. As a secondary goal, more precise data would be gathered by an improved test method, described in this test report.

single event latch-ups (SEL)↗
NASA NTRS2017

Single Event Effect Testing of the Micron MT46V128M8

The Micron MT46V128M8 was tested for single event effects (SEE) at the Texas AM University Cyclotron Facility (TAMU) in June of 2017. Testing revealed a sensitivity to device hang-ups classified as single event functional interrupts (SEFI) and possible soft data errors classified as single event upsets (SEU).

Single Event Functional Interrupts (SEFI)↗
NASA NTRS1997

Nineteenth Space Simulation Conference Cost Effective Testing for the 21st Century

The Nineteenth Space Simulation Conference was hosted by the Institute of Environmental Sciences (IES) and was supported by the American Institute of Aeronautics and Astronautics (AIAA), the American Society for Testing and Materials (ASTM), the National Aeronautics and Space Administration (NASA), and the Canadian Space Agency (CSA). These proceedings attest to the scope of the conference; papers were presented on topics as diverse as shuttle payload contamination effects, simulating Martian environment for testing, to state-of-the-art 6-axis hydraulic shaker testing system. A good cross section of the international aerospace community took advantage of the opportunity to get together, to share their experiences, and to participate in the technical sessions. The two invited keynote speakers were Lieutenant General Malcolm O'Neill (USA, Ret.), past Director of BMDO, and Mr. Thomas Coughlin, Space Programs Manager at the Johns Hopkins University Applied Physics Laboratory. Their most informative and thought provoking talks were on cost effective testing approaches in Defense Department programs for the 21st Century and what part testing plays in the faster, better, cheaper approach for the NEAR and APL programs, respectively. The preceding tutorial and the tour of the Garber Facility of the Air and Space Museum rounded out a comprehensive conference contributing to the knowledge base vital to cost effective testing for successful missions into the 21st Century.

Stecher, Joseph L., III↗
NASA NTRS2012

Space Environmental Effects Testing Capability at the Marshall Space Flight Center

Understanding the effects of the space environment on materials and systems is fundamental and essential for mission success. If not properly understood and designed for, the effects of the environment can lead to degradation of materials, reduction of functional lifetime, and system failure. In response to this need, the Marshall Space Flight Center has developed world class Space Environmental Effects (SEE) expertise and test facilities to simulate the space environment. Capabilities include multiple unique test systems comprising the most complete SEE testing capability available. These test capabilities include charged particle radiation (electrons, protons, ions), ultraviolet radiation (UV), vacuum ultraviolet radiation (VUV), atomic oxygen, plasma effects, space craft charging, lunar surface and planetary effects, vacuum effects, and hypervelocity impacts as well as the combination of these capabilities. In addition to the uniqueness of the individual test capabilities, MSFC is the only NASA facility where the effects of the different space environments can be tested in one location. Combined with additional analytical capabilities for pre- and post-test evaluation, MSFC is a one-stop shop for materials testing and analysis. The SEE testing and analysis are performed by a team of award winning experts nationally recognized for their contributions in the study of the effects of the space environment on materials and systems. With this broad expertise in space environmental effects and the variety of test systems and equipment available, MSFC is able to customize tests with a demonstrated ability to rapidly adapt and reconfigure systems to meet customers needs. Extensive flight experiment experience bolsters this simulation and analysis capability with a comprehensive understanding of space environmental effects.

DeWittBurns, H.↗
NASA NTRS2017

Single-Event Effect Testing of the Vishay Si7414DN n-Type TrenchFET(Registered Trademark) Power MOSFET

This study was being undertaken to determine the single event effect susceptibility of the commercial Vishay 60-V TrenchFET power MOSFET. Heavy-ion testing was conducted at the Texas AM University Cyclotron Single Event Effects Test Facility (TAMU) and the Lawrence Berkeley National Laboratory BASE Cyclotron Facility (LBNL). In addition, initial 200-MeV proton testing was conducted at Massachusetts General Hospital (MGH) Francis H. Burr Proton Beam Therapy Center. Testing was performed to evaluate this device for single-event effects from lower-LET, lighter ions relevant to higher risk tolerant space missions.

proton testing↗
NASA NTRS2014

Single-Event Effect Testing of the Cree C4D40120D Commercial 1200V Silicon Carbide Schottky Diode

This study was undertaken to determine the single event effect (SEE) susceptibility of the commercial silicon carbide 1200V Schottky diode manufactured by Cree, Inc. Heavy-ion testing was conducted at the Texas A&M University Cyclotron Single Event Effects Test Facility (TAMU). Its purpose was to evaluate this device as a candidate for use in the Solar-Electric Propulsion flight project.

silicon carbide (SiC)↗
NASA NTRS1977

Accelerated life testing effects on CMOS microcircuit characteristics

Accelerated life tests were performed on CMOS microcircuits to predict their long term reliability. The consistency of the CMOS microcircuit activation energy between the range of 125 C to 200 C and the range 200 C to 250 C was determined. Results indicate CMOS complexity and the amount of moisture detected inside the devices after testing influences time to failure of tested CMOS devices.

Source record↗
NASA NTRS2006

Single Event Effects Test Results for the Actel ProASIC Plus and Altera Stratix-II Field Programmable Gate Arrays

This work describes radiation testing of Actel's ProASIC Plus and Altera's Stratix-II FPGAs. The Actel Device Under Test (DUT) was a ProASIC Plus APA300-PQ208 nonvolatile, field reprogrammable device which is based on a 0.22micron flash-based LVCMOS technology. Limited investigation has taken place into flash based FPGA technologies, therefore this test served as a preliminary reference point for various SEE behaviors. The Altera DUT was a Stratix-II EP2S60F1020C4. Single Event Upset (SEU) and Single Event Latchup (SEL) were the focus of these studies. For the Actel, a latchup test was done at an effective LET of 75.0 MeV-sq cm/mg at room temperature, and no latchup was detected when irradiated to a total fluence of 1 x 10(exp 7) particles/sq cm. The Altera part was shown to latchup at room temperature.

heavy ions↗
NASA NTRS2018

Single Event Effect Testing of the Analog Devices ADXL354 3-Axis MEMS Accelerometer

The Analog Devices ADXL354 3-AXIS MEMS accelerometer was tested for single-event effects, both destructive and non-destructive. The device was characterized for single-event upset (SEU) sensitivity and evaluated for any possibility of single-event latchup (SEL), single-event dielectric rupture (SEDR) and single-event functional interrupts (SEFI). Single-event transient (SET) response was also monitored.

Single-Event Effect (SEE)↗