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At least 37 records · Page 2

Comparison of single event upset rates for microelectronic memory devices during interplanetary solar particle events

Variability in the methods and models used for single event upset calculations in microelectronic memory devices can lead to a range of possible upset rates. Using heavy ion and proton data for selected DRAM and SRAM memories, we have calculated an array of upset rates in order to compare the Adams worst case interplanetary solar flare model to a model proposed by scientists at the Jet Propulsion Laboratory. In addition, methods of upset rate calculation are compared: the Cosmic Ray Effects on Microelectronics CREME code and a Monte Carlo algorithm developed at the Applied Physics Laboratory. The results show that use of a more realistic, although still conservative, model of the space environment can have significant cost saving benefits.

Mckerracher, P. L.↗

Process Upsets Involving Trace Contaminant Control Systems

Paradoxically, trace contaminant control systems that suffer unexpected upsets and malfunctions can release hazardous gaseous contaminants into a spacecraft cabin atmosphere causing potentially serious toxicological problems. Trace contaminant control systems designed for spaceflight typically employ a combination of adsorption beds and catalytic oxidation reactors to remove organic and inorganic trace contaminants from the cabin atmosphere. Interestingly, the same design features and attributes which make these systems so effective for purifying a spacecraft's atmosphere can also make them susceptible to system upsets. Cabin conditions can be contributing causes of phenomena such as adsorbent "rollover" and catalyst poisoning can alter a systems performance and in some in stances release contamination into the cabin. Evidence of these phenomena has been observed both in flight and during ground-based tests. The following discussion describes specific instances of system upsets found in trace contaminant control systems, groups these specific upsets into general hazard classifications, and recommends ways to minimize these hazards.

Graf, John C.↗

Upset Characterization of the PowerPC405 Hard-core Processor Embedded in Virtex-II Pro Field Programmable Gate Arrays

Shown in this presentation are recent results for the upset susceptibility of the various types of memory elements in the embedded PowerPC405 in the Xilinx V2P40 FPGA. For critical flight designs where configuration upsets are mitigated effectively through appropriate design triplication and configuration scrubbing, these upsets of processor elements can dominate the system error rate. Data from irradiations with both protons and heavy ions are given and compared using available models.

radiation effects↗

Frequency Dependence of Single-event Upset in Advanced Commerical PowerPC Microprocessors

This paper examines single-event upsets in advanced commercial SOI microprocessors in a dynamic mode, studying SEU sensitivity of General Purpose Registers (GPRs) with clock frequency. Results are presented for SOI processors with feature sizes of 0.18 microns and two different core voltages. Single-event upset from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequency up to 1GHz. Frequency and core voltage dependence of single-event upsets in registers is discussed.

single-event upset (SEU)↗

Upset Recovery Human Factors

Accident and incident analyses as well as industry group concerns and recommendations have justified taking a second look at proficiency standards related to upset recovery training and performance. Quite a number of factors and theories have been suggested-- leading the NASA Aviation Safety Program to reconsider manual handling skills in highly automated aircraft particularly in conditions that can potentially lead to Loss of Control events. Our team of Subject Matter Experts (SMEs) first identified 76 Basic Recovery Skills that were important for effective crew response under five different anomaly conditions. In addition to manual handling skills, the skill set included knowledge and cognitive skills, as well as decision making and management skills. Advanced Recovery Skills were identified by combining skills, integrating with crew resource management skills, and developing heuristics for decision making.Using the Advanced Recovery Skill set, the SMEs then developed a generic process flow starting from the problem discovery phase (e.g., identifying an anomaly) through the decision making and management phase (e.g., assessing response options), through the recovery phase (e.g., controlling the aircraft). The generic process flow was refined by testing it against six additional scenarios. The next part of the project was to develop an approach for assessing and revising a generic training curriculum (we used an operators Advanced Qualification Program (AQP) as a framework). Although many of the Basic and Advanced Recovery Skills could be found in the Job Task Listing, they were not always structured or combined in the most effective way. Recommendations were developed for assessing relevant aspects of the Job Task Listing and Continuing Qualification curriculum so that the more comprehensive set of Upset Recovery skillsincluding Human Factors--could be trained and assessed in the most appropriate and effective context. The existing AQP methodology provides a natural way to insert targeted Upset Recovery skills into its system of proficiency objectives, training devices, training activities, and ultimately, into the event sets of a simulator training scenario.

AQP training↗

Study of control system effectiveness in alleviating vortex wake upsets.

The problem of an airplane being upset by encountering the vortex wake of a large transport on takeoff or landing is currently receiving considerable attention. This paper describes the technique and results of a study to assess the effectiveness of automatic control systems in alleviating vortex wake upsets. A six-degree-of-freedom nonlinear digital simulation was used for this purpose. The analysis included establishing the disturbance input due to penetrating a vortex wake from an arbitrary position and angle. Simulations were computed for both a general aviation airplane and a commercial jet transport. Dynamic responses were obtained for the penetrating aircraft with no augmentation and with various command augmentation systems. The results of this preliminary study indicate that it is feasible to use an automatic control system to alleviate vortex encounter upsets.

Johnson, W. A.↗

Analysis of vortex wake encounter upsets

The problem of an airplane being upset by encountering the vortex wake of a large transport on takeoff or landing is currently receiving considerable attention. This report describes the technique and results of a study to assess the effectiveness of automatic control systems in alleviating vortex wake upsets. A six-degree-of-freedom nonlinear digital simulation was used for this purpose. The analysis included establishing the disturbance input due to penetrating a vortex wake from an arbitrary position and angle. Simulations were computed for both a general aviation airplane and a commercial jet transport. Dynamic responses were obtained for the penetrating aircraft with no augmentation, and with various command augmentation systems, as well as with human pilot control. The results of this preliminary study indicate that attitude command augmentation systems can provide significant alleviation of vortex wake upsets; and can do it better than a human pilot.

Johnson, W. A.↗

Transient upset models in computer systems

Essential factors for the design of transient upset monitors for computers are discussed. The upset is a system level event that is software dependent. It can occur in the program flow, the opcode set, the opcode address domain, the read address domain, and the write address domain. Most upsets are in the program flow. It is shown that simple, external monitors functioning transparently relative to the system operations can be built if a detailed accounting is made of the characteristics of the faults that can happen. Sample applications are provided for different states of the Z-80 and 8085 based system.

Mason, G. M.↗

General upper bound on single-event upset rate

A technique of predicting an upper bound on the rate at which single-event upsets due to ionizing radiation occur in semiconducting memory cells is described. The upper bound on the upset rate, which depends on the high-energy particle environment in earth orbit and accelerator cross-section data, is given by the product of an upper-bound linear energy-transfer spectrum and the mean cross section of the memory cell. Plots of the spectrum are given for low-inclination and polar orbits. An alternative expression for the exact upset rate is also presented. Both methods rely only on experimentally obtained cross-section data and are valid for sensitive bit regions having arbitrary shape.

Chlouber, Dean↗

Multiple single event upsets in CMOS static rams

The occurrence of multiple upset errors during ground tests can contaminate the data and lead to error cross sections which are too high. In space, multiple errors may produce higher upsets than predicted and if they occur in single words they can defeat error detection and correction hardware. This investigation involves data which were taken during an experimental study of dose imprint effects in static memories. The results show that multiple errors occurred mainly for heavy ions with high linear energy transfers and with the majority of these in the soft upset sections of the dose-imprinted memory samples. The percentages of the total number of errors which were singles, doubles, and triplets, were determined as a function of LET, dose, and soft or hard section of the devices. The experimental observations are compared to the predictions of simple binomial statistics.

Stassinopoulos, E. G.↗

Markovian Statistical Data Analysis of Single-Event Upsets Triggered by High Intensity Neutrons

This paper analyzes data from a single-event upset experiment conducted at the Los Alamos National Laboratory. Statistical tools, based on well-known x(sup 2) hypothesis testing theory, are used to determine if sequences of upsets can be modeled as a homogeneous Markov chain of a specific order. The experiment consisted of radiating a new experimental flight control computer (FCC) with a high intensity neutron beam while the FCC controlled a simulation of a Boeing 737. The analyzed data is a sequence of states that indicates when the FCC is under an upset condition.

Lakdawala, Anushka V.↗

Method for characterizing the upset response of CMOS circuits using alpha-particle sensitive test circuits

A method for predicting the SEU susceptibility of a standard-cell D-latch using an alpha-particle sensitive SRAM, SPICE critical charge simulation results, and alpha-particle interaction physics. A technique utilizing test structures to quickly and inexpensively characterize the SEU sensitivity of standard cell latches intended for use in a space environment. This bench-level approach utilizes alpha particles to induce upsets in a low LET sensitive 4-k bit test SRAM. This SRAM consists of cells that employ an offset voltage to adjust their upset sensitivity and an enlarged sensitive drain junction to enhance the cell's upset rate.

Buehler, Martin G.↗

Upset Simulation and Training Initiatives for U.S. Navy Commercial Derived Aircraft

Militarized versions of commercial platforms are growing in popularity due to many logistical benefits in the form of commercial off-the-shelf (COTS) parts, established production methods, and commonality for different certifications. Commercial data and best practices are often leveraged to reduce procurement and engineering development costs. While the developmental and cost reduction benefits are clear, these militarized aircraft are routinely operated in flight at significantly different conditions and in significantly different manners than for routine commercial flight. Therefore they are at a higher risk of flight envelope exceedance. This risk may lead to departure from controlled flight and/or aircraft loss1. Historically, the risk of departure from controlled flight for military aircraft has been mitigated by piloted simulation training and engineering analysis of typical aircraft response. High-agility military aircraft simulation databases are typically developed to include high angles of attack (AoA) and sideslip due to the dynamic nature of their missions and have been developed for many tactical configurations over the previous decades. These aircraft simulations allow for a more thorough understanding of the vehicle flight dynamics characteristics at high AoA and sideslip. In recent years, government sponsored research on transport airplane aerodynamic characteristics at high angles of attack has produced a growing understanding of stall/post-stall behavior. This research along with recent commercial airline training initiatives has resulted in improved understanding of simulator-based training requirements and simulator model fidelity.2-5 In addition, inflight training research over the past decade has produced a database of pilot performance and recurrency metrics6. Innovative solutions to aerodynamically model large commercial aircraft for upset conditions such as high AoA, high sideslip, and ballistic damage, as well as capability to accurately account for scaling factors, is necessary to develop realistic engineering and training simulations. Such simulations should significantly reduce the risk of departure from controlled flight, loss of aircraft, and ease the airworthiness certification process. The characteristics of commercial derivative aircraft are exemplified by the P-8A Multi-mission Maritime Aircraft (MMA) aircraft, and the largest benefits of initial investigation are likely to be yielded from this platform. The database produced would also be utilized by flight dynamics engineers as a means to further develop and investigate vehicle flight characteristics as mission tactics evolve through the years ahead. This paper will describe ongoing efforts by the U.S. Navy to develop a methodology for simulation and training for large commercial-derived transport aircraft at unusual attitudes, typically experienced during an aircraft upset. This methodology will be applied to a representative Navy aircraft (P-8A) and utilized to develop a robust simulation that should accurately represent aircraft response in these extremes. Simulation capabilities would then extend to flight dynamics analysis and simulation, as well as potential training applications. Recent evaluations of integrated academic, ground-based simulation, and in-flight upset training will be described along with important lessons learned, specific to military requirements.

Donaldson, Steven↗

Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets of NAND Flash Memory

We investigated the single-event effect (SEE) susceptibility of the Micron 16 nm NAND flash, and found the single-event upset (SEU) cross section varied inversely with fluence. The SEU cross section decreased with increasing fluence. We attribute the effect to the variable upset sensitivities of the memory cells. The current test standards and procedures assume that SEU follow a Poisson process and do not take into account the variability in the error rate with fluence. Therefore, heavy ion irradiation of devices with variable upset sensitivity distribution using typical fluence levels may underestimate the cross section and on-orbit event rate.

Single Event Effects (SEE)↗

Single-event upset in evolving commercial silicon-on-insulator microprocessor technologies

Single-event upset effects from heavy ions are measured for Motorola and IBM silicon-on-insulator (SOI) microprocessors with different feature sizes and core voltages. Multiple-bit upsets (MBU) in registers and were measured and compared with single-bit upsets. Also, the scaling of the cross section with reduction of feature size for SOI microprocessors was discussed.

Yoder, G. I.↗

Envelope Protection and Recovery Guidance for Upset Conditions

The slides are an overview and summary of past and current research projects in the field of envelope protection, upset prevention and upset recovery, with the aim to avoid loss of control accidents and improve safety in air transportation.

aviation safety↗

Single-event upset in advanced PowerPC microprocessors

Proton and heavy-ion single-event upset susceptibility has been measured for the MotorolaPowerPC7400. The results show that this advanced device has low upset susceptibility, despite the scaling and design advances.

radiation single-event upset↗

Single Event Upset Effects on the Clementine Solid State Data Recorder

The sensitivity of the Clementine 2.1 Gbit Solid State Data Recorder (SSDR) to single event upsets was characterized in ground tests. Subsequent in-situ measurements of the ambient radiation environment by experiments on-board Clementine permitted evaluation of the ability of models of the single event phenomenon in the SSDR to be tested using actual data. Initial results from the analysis reveal a nearly constant background upset rate of ~71 bit flips/day for the SSDR. There is no obvious correlation with a solar proton event recorded by Clementine and several other spacecraft on 20-21 February 1994, indicating that the SSDR was not sensitive to protons. The constant rate is thus interpreted as being a function of the Galactic Cosmic Ray heavy ion environment. A pronounced lunar orbit altitude dependence has also been identified in the data though the cause has not yet been unambiguously identified.

Clementine↗