Deterministic Positioning of Defect Based Qubits using Ion Beam Implantation for Nanofabrication and Modification.
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Hybrid method was developed based on a need to generate accurate sensitivities for specified systems with CLUTCH. This new method provides improved sensitivities with HMF-028-001, specifically with 238 U in the large reflector region. With the importance of each voxel predetermined with the adjoint flux, the hybrid method is able to generate more accurate sensitivities. More testing is needed for other types of systems and materials (i.e., thermal and intermediate energy ranges and different moderators and reflectors). Initial results are very promising and continual development of the new hybrid method is currently in progress.
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