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Single-Event Effect Testing of the Vishay Si7414DN n-Type TrenchFET(Registered Trademark) Power MOSFET
This study was being undertaken to determine the single event effect susceptibility of the commercial Vishay 60-V TrenchFET power MOSFET. Heavy-ion testing was conducted at the Texas AM University Cyclotron Single Event Effects Test Facility (TAMU) and the Lawrence Berkeley National Laboratory BASE Cyclotron Facility (LBNL). In addition, initial 200-MeV proton testing was conducted at Massachusetts General Hospital (MGH) Francis H. Burr Proton Beam Therapy Center. Testing was performed to evaluate this device for single-event effects from lower-LET, lighter ions relevant to higher risk tolerant space missions.
Proton Damage Effects in Linear Integrated Circuts
Proton testing of linear circuits has identified devices where significantly more damage occurs at equivalent total dose levels with protons than tests with gamma rays.
Europa Missions: Generic Materials Test Methodology
This viewgraph presentation discusses: radiation fundamentals, radiation damage, how radiation dosage is determined, fluence testing approaches, ionization damage exposure, displacement damage exposure, Europa energy "bins", rationale for group flux (energy bins), electron/proton group fluences, electron beam exposure testing, proton sources, reactor exposures, gamma exposures, preliminary exposure findings, testing caveats, preliminary conclusions, internal discharge, and electron dose depth curves.
A Nuclear Interaction Model for Understanding Results of Single Event Testing with High Energy Protons
An internuclear cascade and evaporation model has been adapted to estimate the LET spectrum generated during testing with 200 MeV protons. The model-generated heavy ion LET spectrum is compared to the heavy ion LET spectrum seen on orbit. This comparison is the basis for predicting single event failure rates from heavy ions using results from a single proton test. Of equal importance, this spectra comparison also establishes an estimate of the risk of encountering a failure mode on orbit that was not detected during proton testing. Verification of the general results of the model is presented based on experiments, individual part test results, and flight data. Acceptance of this model and its estimate of remaining risk opens the hardware verification philosophy to the consideration of radiation testing with high energy protons at the board and box level instead of the more standard method of individual part testing with low energy heavy ions.
RHrFPGA Radiation-Hardened Re-programmable Field-Programmable Gate Array
Viewgraphs on the development of the Radiation-Hardened Re-programmable Field-Programmable Gate Array (RHrFPGA) are presented. The topics include: 1) Radiation Test Suite; 2) Testing Interface; 3) Test Configuration; 4) Facilities; 5) Test Programs; 6) Test Procedure; and 7) Test Results. A summary of heavy ion and proton testing is also included.
Satellite Protons as a Test of Solar Neutron Observations
Satellite-borne detection of decay protons as test of solar neutron observation
Ground radiation tests and flight atomic oxygen tests of ITO protective coatings for Galileo Spacecraft
Radiation simulation tests (protons and electrons) were performed along with atomic oxygen flight tests aboard the Shuttle to space qualify the surface protective coatings. The results, which contributed to the selection of indium-tin-oxide (ITO) coated polyester as the material for the thermal blankets of the Galileo Spacecraft, are given here. Two candidate materials, polyester and Fluorglas, were radiation-tested to determine changes at simulated Jovian radiation levels. The polyester exhibited a smaller weight loss (2.8) than the Fluorglas (8.8 percent). Other changes of polyester are given. During low-earth orbit, prior to transit to Jupiter, the thermal blankets would be exposed to atomic oxygen. Samples of uncoated and ITO-coated polyesters were flown on the Shuttle. Qualitative results are given which indicated that the ITO coating protected the underlying polyester.
Radiation Response of Emerging High Gain, Low Noise Detectors
Data illustrating the radiation response of emerging high gain, low noise detectors are presented. Ionizing dose testing of silicon internal discrete avalanche photodiodes, and 51-MeV proton testing of InGaAs/InAlAs avalanche photodiodes operated in Geiger mode are discussed.
EdgeCortix SAKURA-I Machine-Learning, PCIe Accelerator SEE Heavy Ion Test Report
To enable autonomy in space, machine-learning and computer vision applications become invaluable for sensor processing. However, these algorithms are computationally complex and unfeasible for many embedded central processing units (CPUs) and usually require external coprocessors, such as graphics processing units (GPUs) or accelerators specific to the application, including application specific integrated circuits (ASICs). In power-constrained systems, GPUs tend to consume more power than is acceptable (>40W), so lower-power accelerators have shown promise to provide the performance needed under spacecraft constraints. For radiation engineers, developing methodologies that can properly test CPUs, GPUs, and accelerators, and enable comparisons between them remains a necessary complication to solve as the devices become more complex. The methodology in this test aims to be a start in developing a baseline single-event effect (SEE) test for client-device machine learning accelerators. This category of devices do not host their own operating system. This testing campaign is a continuation of a previous 200 MeV proton test performed in January 2024. This report covers two heavy ion tests of the SAKURA-I card: one in April 2024, and one in June 2024. Additional data was needed after the April test due to ion-range issues experienced at higher linear-energy transfers (LETs). These range issues are described in more detail in Section 8. This experiment characterizes SEEs and data error susceptibility of the EdgeCortix SAKURA-I machine-learning accelerator under heavy ions. The device was monitored for single event upsets (SEUs) and single event functional interrupts (SEFIs) at the Lawrence Berkeley National Laboratory’s 88-inch cyclotron. The SAKURA-I board accelerates machine-learning inference applications on a host computer through a PCIex16 connection. For the purposes of devising an end to end automated analysis workflow for this experiment, the YOLO-V5 and SSD300 objection-detection models, and the ResNet-50, EfficientNet, and MobileNetV2 image classification models were used as a representative suite of analytical machine-learning models.
Test report for single event effects of the 80386DX microprocessor
The Jet Propulsion Laboratory Section 514 Single Event Effects (SEE) Testing and Analysis Group has performed a series of SEE tests of certain strategic registers of Intel's 80386DX CHMOS 4 microprocessor. Following a summary of the test techniques and hardware used to gather the data, we present the SEE heavy ion and proton test results. We also describe the registers tested, along with a system impact analysis should these registers experience a single event upset.
Advanced Material Studies for High Intensity Proton Production Targets and Windows
The titanium alloy Ti6Al4V is widely used in accelerator facilities as beam windows, which are exposed to high cycle compressive stress waves from intense pulsed proton beams. Such materials interacting with the beam are subject to various forms of radiation damage, which can adversely affect their endurance limit. However, no fatigue data is currently available for high energy proton irradiated titanium alloy. Due to limitations in proton irradiation facilities, only miniature flat samples can be used for irradiation. To address this issue, we have developed a custom-made bend fatigue tester at Fermilab specifically for testing proton irradiated titanium alloy. In this presentation, we report on the fatigue test results obtained from this custom-fatigue tester using a non-ASTM standard specimen design. We plan to validate these sparse fatigue data with ASTM standard samples using standard fatigue samples. Furthermore, we have modified another commercial bend fatigue tester to accommodate miniature samples, and discuss some inherent deficiencies of the commercial fatigue tester to test miniature samples. To overcome this issue, a new fixture design is presented, which enables satisfactory fatigue testing on miniature samples over long periods. Finally, we present an upgrade to the custom-fatigue tester, featuring this new fixture design.
Advanced Material Studies for High Intensity Proton Production Targets and Windows
The titanium alloy Ti6Al4V is widely used in accelerator facilities as beam windows, which are exposed to high cycle compressive stress waves from intense pulsed proton beams. Such materials interacting with the beam are subject to various forms of radiation damage, which can adversely affect their endurance limit. However, no fatigue data is currently available for high energy proton irradiated titanium alloy. Due to limitations in proton irradiation facilities, only miniature flat samples can be used for irradiation. To address this issue, we have developed a custom-made bend fatigue tester at Fermilab specifically for testing proton irradiated titanium alloy. In this presentation, we report on the fatigue test results obtained from this custom-fatigue tester using a non-ASTM standard specimen design. We plan to validate these sparse fatigue data with ASTM standard samples using standard fatigue samples. Furthermore, we have modified another commercial bend fatigue tester to accommodate miniature samples, and discuss some inherent deficiencies of the commercial fatigue tester to test miniature samples. To overcome this issue, a new fixture design is presented, which enables satisfactory fatigue testing on miniature samples over long periods. Finally, we present an upgrade to the custom-fatigue tester, featuring this new fixture design.
Status of NEPP Radiation Testing 3D NAND Flash
This work provides a current update of radiation testing activities on 3D NAND flash memories in support of the NEPP program. Single-event effects data from heavy-ion and low-energy proton testing is highlighted on a state of the art memory device.
Status of NEPP Radiation Testing 3D NAND Flash
This work provides a current update of radiation testing activities on 3D NAND flash memories in support of the NEPP program. Single-event effects data from heavy-ion and low-energy proton testing is highlighted on a state of the art memory device.
What Can We Learn From Proton Recoils about Heavy-Ion SEE Sensitivity?
The fact that protons cause single-event effects (SEE) in most devices through production of light-ion recoils has led to attempts to bound heavy-ion SEE susceptibility through use of proton data. Although this may be a viable strategy for some devices and technologies, the data must be analyzed carefully and conservatively to avoid over-optimistic estimates of SEE performance. We examine the constraints that proton test data can impose on heavy-ion SEE susceptibility.
Substorm associated ion acceleration in the dynamic magnetotail
Ion acceleration and flux increase associated with substorm energetic particle injections are investigated on the basis of geosynchronous observations and test proton orbits in the dynamic fields of a three dimensional magnetohydrodynamic simulation of neutral line formation and dipolarization in the magnetotail. The energetic particle flux changes obtained from the test particle orbits agree well with observations that demonstrate rapid ion flux increases at energies of above 20 keV. The injection region inferred from the test particles has a sharp earthward boundary and a sharp ragged tailward boundary. The earthward portion of the enhanced ion flux can be traced to the enhanced cross-tail electric field associated with the near-earth x-type neutral line. Due to the rapid earthward motion of accelerated ions away from the neutral line, this boundary is displaced earthward to where the energetic ions become more adiabatic in the stronger dipolar field.