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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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This paper presents a reliability evaluation methodology to obtain the statistical reliability information of memory chips for space applications when the test sample size needs to be kept small because of the high cost of the radiation hardness memories.
Application of Semiconductor devices in high reliability space systems requires a thorough understanding of the reliability and failure mechanisms associated with the selected devices.
Many ways of estimating software systems' reliability, or reliability-related quantities, have been developed over the past several years. In this panel, we discuss practical issues to be addressed in implementing software reliabilty measurement techniques in a production development environment.
Although the weakest link of CSP assembly reliability has been often internal package failure, solder joint fatigue is still considered to be the key factor for reliability.
Physics of failure approaches have gained wide spread acceptance within the electronic reliability community. These methodologies involve identifying root cause failure mechanisms, developing associated models, and utilizing these models to inprove time to market, lower development and build costs and higher reliability. The methodology outlined herein sets forth a process, based on integration of both physics and engineering principles, for achieving the same goals.
JPL, in a partnership with an industrial consortium, is currently engaged in the investigation of reliability and quality issues if ball grid array (BGA) packages as they may be applied to space flight electronics. Performing tests to determine the solder joint reliability of assemblies using BGAs under temperature cycling has proved to be a real challenge for test engineers.
This paper describes the implementation of a software reliability measurement tool, CASRE, that includes reliability models that run in a Microsoft Windows environment.
Plastic Encapsulated Microelectronics (PEM) reliability is affected by many factors. Glass transition temperature (Tg) is one such factor. In this presentation issues relating to PEM reliability and the effect of low glass transition temperature epoxy mold compounds are presented.
In this position statement I briefly describe how the software reliability problem has changed over the years, and the primary reasons for the recent creation of the Laboratory for Reliable Software at JPL.
This paper provides a discussion of the subject and an approach to establish a reliability and qualification methodology to facilitate the utilization of state-of-the-art advanced microelectronic devices and structures in high reliability applications.
This plan is the accumulation of substantial work by a large number of individuals. The Ultra-Reliability team consists of representatives from each center who have agreed to champion the program and be the focal point for their center. A number of individuals from NASA, government agencies (including the military), universities, industry and non-governmental organizations also contributed significantly to this effort. Most of their names may be found on the Ultra-Reliability PBMA website.
This viewgraph presentation gives a general overview of NASA's ultra reliability areas. The contents include: 1) Objectives; 2) Approach; 3) Ultra Reliability Areas; 4) Plan Overview; 5) Work Flows; and 6) Customers.
Radiation effects on materials and electronic parts constrain the lifetime of flight systems visiting Europa. Understanding mission lifetime limits is critical to the design and planning of such a mission. Therefore, the operational aspects of radiation dose are a mission success issue. To predict and manage mission lifetime in a high radiation environment, system engineers need capable tools to trade radiation design choices against system design and reliability, and science achievements. Conventional tools and approaches provided past missions with conservative designs without the ability to predict their lifetime beyond the baseline mission.This paper describes a more systematic approach to understanding spacecraft design margin, allowing better prediction of spacecraft lifetime. This is possible because of newly available electronic parts radiation effects statistics and an enhanced spacecraft system reliability methodology. This new approach can be used in conjunction with traditional approaches for mission design. This paper describes the fundamentals of the new methodology.
The recently launched Mars Science Laboratory (MSL) flagship mission, named Curiosity, is the most complex rover ever built by NASA and is scheduled to touch down on the red planet in August, 2012 in Gale Crater. The rover and its instruments will have to endure the harsh environments of the surface of Mars to fulfill its main science objectives. Such complex systems require reliable microelectronic components coupled with adequate component and system-level design margins. Reliability aspects of these elements of the spacecraft system are presented from bottom- up and top-down perspectives.
NASA, the aerospace community, and other high reliability (hi-rel) users of advanced microelectronic products face many challenges as technology continues to scale into the deep sub- micron region and ULP devices are sought after. Technology trends, ULP microelectronics, scaling and performance tradeoffs, reliability considerations, and spacecraft environments will be presented from a ULP perspective for space applications.
NASA has developed an objectives based hierarchy for guiding Reliability and Maintainability activities. This presentation overviews the hierarchy and proposes to the international trilateral partners to formulate a task force to consider the elements of the NASA RM framework, as captured in the hierarchy of RM considerations, to identify commonalities and differences in the way reliability and maintainability is addressed by the flight projects among the partners.
Present NASA's current and recommended concepts for Mission Extension and De-orbit reliability Methodologies. NASA's current and recommended approaches ensuring de-orbit requirements are not unnecessarily driving mission design efforts or adding incresed costs or risks to manufacturing solutions without providing benefit to missionsand will assist in moving reliability estimation from piece part performance estimates to component history and system-level testing based estimations.
Many ways of estimating software systems' reliability, or reliability-related quantities, have been developed over the past several years.