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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 91 records · Page 5
All sourcesNASA NTRSDOE OSTI
NASA NTRS1999

1999 NSREC Short Course: Proton Effects and Test Issues for Satellite Designers: Displacement Effects

This portion of the Short Course is divided into two segments to separately address the two major proton-related effects confronting satellite designers: ionization effects and displacement damage effects. While both of these topics are deeply rooted in "traditional" descriptions of space radiation effects, there are several factors at play to cause renewed concern for satellite systems being designed today. For example, emphasis on Commercial Off-The-Shelf (COTS) technologies in both commercial and government systems increases both Total Ionizing Dose (TID) and Single Event Effect (SEE) concerns. Scaling trends exacerbate the problems, especially with regard to SEEs where protons can dominate soft error rates and even cause destructive failure. In addition, proton-induced displacement damage at fluences encountered in natural space environments can cause degradation in modern bipolar circuitry as well as in many emerging electronic and opto-electronic technologies.

Marshall, Cheryl J.↗
NASA NTRS1998

Overview of Device SEE Susceptibility from Heavy Ions

A fifth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications (1,2,3,4) in December issues for 1985, 1987, 1989, and 1991. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are evaluated.

Nichols, D. K.↗
NASA NTRS2005

Reconfigurable Processing Module

To accommodate a wide spectrum of applications and technologies, NASA s Exploration System's Missions Directorate has called for reconfigurable and modular technologies to support future missions to the moon and Mars. In response, Langley Research Center is leading a program entitled Reconfigurable Scaleable Computing (RSC) that is centered on the development of FPGA-based computing resources in a stackable form factor. This paper details the architecture and implementation of the Reconfigurable Processing Module (RPM), which is the key element of the RSC system. The RPM is an FPGA-based, space-qualified printed circuit assembly leveraging terrestrial/commercial design standards into the space applications domain. The form factor is similar to, and backwards compatible with, the PCI-104 standard utilizing only the PCI interface. The size is expanded to accommodate the required functionality while still better than 30% smaller than a 3U CompactPCI(TradeMark)card and without the overhead of the backplane. The architecture is built around two FPGA devices, one hosting PCI and memory interfaces, and another hosting mission application resources; both of which are connected with a high-speed data bus. The PCI interface FPGA provides access via the PCI bus to onboard SDRAM, flash PROM, and the application resources; both configuration management as well as runtime interaction. The reconfigurable FPGA, referred to as the Application FPGA - or simply "the application" - is a radiation-tolerant Xilinx Virtex-4 FX60 hosting custom application specific logic or soft microprocessor IP. The RPM implements various SEE mitigation techniques including TMR, EDAC, and configuration scrubbing of the reconfigurable FPGA. Prototype hardware and formal modeling techniques are used to explore the performability trade space. These models provide a novel way to calculate quality-of-service performance measures while simultaneously considering fault-related behavior due to SEE soft errors.

Somervill, Kevin↗
NASA NTRS2005

Impact of Scaled Technology on Radiation Testing and Hardening

This presentation gives a brief overview of some of the radiation challenges facing emerging scaled digital technologies with implications on using consumer grade electronics and next generation hardening schemes. Commercial semiconductor manufacturers are recognizing some of these issues as issues for terrestrial performance. Looking at means of dealing with soft errors. The thinned oxide has indicated improved TID tolerance of commercial products hardened by "serendipity" which does not guarantee hardness or say if the trend will continue. This presentation also focuses one reliability implications of thinned oxides.

LaBel, Kenneth A.↗
NASA NTRS1995

Trends in Device SEE Susceptibility from Heavy Ions

The sixth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications in December issues of IEEE - Nuclear Science Transactions for 1985, 1987, 1989, 1991, and the IEEE Workshop Record, 1993. Trends in SEE susceptibility (including soft errors and latchup) for state-of- are evaluated.

single event effects latchup radiation hardening↗
NASA NTRS2007

TID and SEE Response of an Advanced Samsung 4G NAND Flash Memory

Initial total ionizing dose (TID) and single event heavy ion test results are presented for an unhardened commercial flash memory, fabricated with 63 nm technology. Results are that the parts survive to a TID of nearly 200 krad (SiO2), with a tractable soft error rate of about 10(exp -l2) errors/bit-day, for the Adams Ten Percent Worst Case Environment.

Oldham, Timothy R.↗
DOE OSTI2018

Multi-petascale highly efficient parallel supercomputer

A Multi-Petascale Highly Efficient Parallel Supercomputer of 100 petaflop-scale includes node architectures based upon System-On-a-Chip technology, where each processing node comprises a single Application Specific Integrated Circuit (ASIC). The ASIC nodes are interconnected by a five dimensional torus network that optimally maximize the throughput of packet communications between nodes and minimize latency. The network implements collective network and a global asynchronous network that provides global barrier and notification functions. Integrated in the node design include a list-based prefetcher. The memory system implements transaction memory, thread level speculation, and multiversioning cache that improves soft error rate at the same time and supports DMA functionality allowing for parallel processing message-passing.

97 MATHEMATICS AND COMPUTING↗
DOE OSTI2023

Accelerated Nuclear Radiation Effects on the Raspberry Pi 3B+ and Pi 4

Raspberry Pi™ computers running Linux and embedded benchmarks are subjected to radiation testing in the neutron beam at LANSCE. The ARM® Cortex®-A53 in the Raspberry Pi 3B+ versus ARM® Cortex®-A72 in the Raspberry Pi 4, single-core versus multi-core, and small versus large array SBU cross sections are compared. Results for the A53 and the A72 are similar. The results of one process on one of four cores and four identical processes on four cores are presented. The results of the array size show that there is more going on than just an increase in size. Linux is helpful in relating some errors that would have been classified as SEFI to an upset in a single bit.

36 MATERIALS SCIENCE↗
NASA NTRS1991

Soft X Ray Telescope (SXT) focus error analysis

The analysis performed on the soft x-ray telescope (SXT) to determine the correct thickness of the spacer to position the CCD camera at the best focus of the telescope and to determine the maximum uncertainty in this focus position due to a number of metrology and experimental errors, and thermal, and humidity effects is presented. This type of analysis has been performed by the SXT prime contractor, Lockheed Palo Alto Research Lab (LPARL). The SXT project office at MSFC formed an independent team of experts to review the LPARL work, and verify the analysis performed by them. Based on the recommendation of this team, the project office will make a decision if an end to end focus test is required for the SXT prior to launch. The metrology and experimental data, and the spreadsheets provided by LPARL are used at the basis of the analysis presented. The data entries in these spreadsheets have been verified as far as feasible, and the format of the spreadsheets has been improved to make these easier to understand. The results obtained from this analysis are very close to the results obtained by LPARL. However, due to the lack of organized documentation the analysis uncovered a few areas of possibly erroneous metrology data, which may affect the results obtained by this analytical approach.

Ahmad, Anees↗
NASA NTRS1982

Fault-tolerance memory system architecture for radiation induced errors

A fault-tolerant memory (FTM) architecture is presented which can be used to overcome soft memory errors induced by alpha particles, cosmic radiation, or other random sources. The characteristics of the FTM are presented, a mathematical model is developed, and numerical examples are considered to illustrate the effectiveness of the approach. The FTM architecture has been incorporated in the NASA Standard Spacecraft Computer (NSSC-II) which will be employed in a variety of future space payloads and experiments.

White, J. B., Jr.↗
NASA NTRS1993

Compact disk error measurements

The objectives of this project are as follows: provide hardware and software that will perform simple, real-time, high resolution (single-byte) measurement of the error burst and good data gap statistics seen by a photoCD player read channel when recorded CD write-once discs of variable quality (i.e., condition) are being read; extend the above system to enable measurement of the hard decision (i.e., 1-bit error flags) and soft decision (i.e., 2-bit error flags) decoding information that is produced/used by the Cross Interleaved - Reed - Solomon - Code (CIRC) block decoder employed in the photoCD player read channel; construct a model that uses data obtained via the systems described above to produce meaningful estimates of output error rates (due to both uncorrected ECC words and misdecoded ECC words) when a CD disc having specific (measured) error statistics is read (completion date to be determined); and check the hypothesis that current adaptive CIRC block decoders are optimized for pressed (DAD/ROM) CD discs. If warranted, do a conceptual design of an adaptive CIRC decoder that is optimized for write-once CD discs.

Howe, D.↗
NASA NTRS2013

Calibration of the Soft X-ray Telescopes (SXT) Onboard the ASTRO-H Satellite

ASTRO-H is an astrophysics satellite dedicated for non-dispersive X-ray spectroscopic study on selective celestial X-ray sources. Among the onboard instruments there are four Wolter-I X-ray mirrors of their reflectors' figure in conical approximation. Two of the four are soft X-ray mirrors, of which the energy range is from a few hundred eV to 15 keV. The focal point instruments will be a calorimeter (SXS) and a CCD camera (SXI), respectively. The mirrors were in quadrant configuration with photons being reflected consecutively in the primary and secondary stage before landing on the focal plane of 5.6 m away from the interface between the two stages. The reflectors of the mirror are made of heat-formed aluminum substrate of the thickness gauged of 152 m, 229 m, and 305 m of the alloy 5052 H-19, followed by epoxy replication on gold-sputtered smooth Pyrex cylindrical mandrels to acquire the X-ray reflective surface. The epoxy layer is 10 m nominal and surface gold layer of 0.2 m. Improvements on angular response over its predecessors, e.g. Astro-E1/Suzaku mirrors, come from error reduction on the figure, the roundness, and the grazing angle/radius mismatching of the reflecting surface, and tighter specs and mechanical strength on supporting structure to reduce the reflector positioning and the assembly errors. Each soft x-ray telescope (SXT), FM1 or FM2, were integrated from four independent quadrants of mirrors. The stray-light baffles, in quadrant configuration, were mounted onto the integrated mirror. Thermal control units were attached to the perimeter of the integrated mirror to keep the mirror within operating temperature in space. The completed instrument went through a series of optical alignment, thus made the quadrant images confocal and their optical axes in parallel to achieve highest throughput possible. Environmental tests were carried out, and optical quality of the telescopes has been confirmed. The optical and x-ray calibrations also include: angular resolution, effective area in the energy range of ~ 0.4 - 12keV, off-axis response, etc. Some of those are being carried out by our counterpart at JAXA/ISAS, Japan. We report the calibration results of the FM1 and FM2 that were obtained at Goddard Space Flight Center.

ASTRO-H Satellite↗
DOE OSTI2020

Validating Extreme Scale Resilience with Veracity (Final Project Report)

As semiconductor technology continues to scale to smaller dimensions and as power-consumption of processor chips continues to increase in importance, there is significant uncertainty about the reliability of future large-scale computers. This uncertainty impacts algorithm design and application development, as well as decisions about system operation policy and provisioning decisions. The Veracity endeavored to answer pertinent questions regarding system reliability and resilience with the goal of enabling reliable science on future leadership machines while keeping overprovisioning low.

97 MATHEMATICS AND COMPUTING↗
NASA NTRS1988

Studies Of Single-Event-Upset Models

Report presents latest in series of investigations of "soft" bit errors known as single-event upsets (SEU). In this investigation, SEU response of low-power, Schottky-diode-clamped, transistor/transistor-logic (TTL) static random-access memory (RAM) observed during irradiation by Br and O ions in ranges of 100 to 240 and 20 to 100 MeV, respectively. Experimental data complete verification of computer model used to simulate SEU in this circuit.

Zoutendyk, J. A.↗
NASA NTRS2007

Proximity Navigation of Highly Constrained Spacecraft

Bandit is a 3-kg automated spacecraft in development at Washington University in St. Louis. Bandit's primary mission is to demonstrate proximity navigation, including docking, around a 25-kg student-built host spacecraft. However, because of extreme constraints in mass, power and volume, traditional sensing and actuation methods are not available. In particular, Bandit carries only 8 fixed-magnitude cold-gas thrusters to control its 6 DOF motion. Bandit lacks true inertial sensing, and the ability to sense position relative to the host has error bounds that approach the size of the Bandit itself. Some of the navigation problems are addressed through an extremely robust, error-tolerant soft dock. In addition, we have identified a control methodology that performs well in this constrained environment: behavior-based velocity potential functions, which use a minimum-seeking method similar to Lyapunov functions. We have also adapted the discrete Kalman filter for use on Bandit for position estimation and have developed a similar measurement vs. propagation weighting algorithm for attitude estimation. This paper provides an overview of Bandit and describes the control and estimation approach. Results using our 6DOF flight simulator are provided, demonstrating that these methods show promise for flight use.

Scarritt, S.↗
NASA NTRS2017

Single Event Effect Testing of the Analog Devices ADV212

The Analog Devices ADV212 was initially tested for single event effects (SEE) at the Texas AM University Cyclotron Facility (TAMU) in July of 2013. Testing revealed a sensitivity to device hang-ups classified as single event functional interrupts (SEFI), soft data errors classified as single event upsets (SEU), and, of particular concern, single event latch-ups (SEL). All error types occurred so frequently as to make accurate measurements of the exposure time, and thus total particle fluence, challenging. To mitigate some of the risk posed by single event latch-ups, circuitry was added to the electrical design to detect a high current event and automatically recycle power and reboot the device. An additional heavy-ion test was scheduled to validate the operation of the recovery circuitry and the continuing functionality of the ADV212 after a substantial number of latch-up events. As a secondary goal, more precise data would be gathered by an improved test method, described in this test report.

single event latch-ups (SEL)↗