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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records

Total dose effect on soft error rate for dynamic metal-oxide-semiconductor memory cells

A simple model for the soft error rate for dynamic metal-oxide-semiconductor random access memories due to normal galactic radiation was devised and then used to calculate the rate of decrease of the single-event-upset rate with total radiation dose. The computation shows that the decrease in the soft error rate is less than 10 percent per day if the shielding is 0.5 g/sq cm and the spacecraft is in a geosynchronous orbit. The decrease is considerably less in a polar orbiting device.

Benumof, Reuben↗

Compiled Data On Single-Event Effects Caused By Heavy Ions

Report presents test data on susceptibility of new set of digital integrated circuits and other semiconductor products to single-event effects (soft errors and latchups) caused by heavy ions incident at high energies. Data used to develop generalizations for protecting electronic equipment from single-event effects. In some cases, tested parts selected as candidates for use in specific applications.

Nichols, Donald K.↗

Scaling and technology issues for soft error rates

Th effects of device technology and scaling on soft error rates are discussed, using information obtained from both the device and space communities as a guide to determine the net effect on soft errors.

soft error rate space radiation high-energy proton↗

Comments on the gamma-ray burst catalog of Mazets et al. /1981a/

A correlation has been discovered between the Venera spacecraft locations and the gamma-ray burst positions reported in the KONUS catalog (Mazets et al., 1981a). The reason for the correlation is not clear, but it could be due to spatial selection effects and/or large localization errors for weak or soft bursts. Whatever the cause, it seems likely that this systematic bias might significantly affect catalog results pertaining to gamma burst locations, intensity distributions, and spectra. For example, it can explain why the KONUS galactic latitude distribution is peaked significantly south of the galactic equator. Apparent discrepanices between the KONUS and Los Alamos gamma burst data bases are noted.

Laros, J. G.↗

Bipolar junction transistor models for circuit simulation of cosmic-ray-induced soft errors

This paper examines bipolar junction transistor models suitable for calculating the effects of large excursions of some of the variables determining the operation of a transistor. Both the Ebers-Moll and Gummel-Poon models are studied, and the junction and diffusion capacitances are evaluated on the basis of the latter model. The most interesting result of this analysis is that a bipolar junction transistor when struck by a cosmic particle may cause a single event upset in an electronic circuit if the transistor is operated at a low forward base-emitter bias.

Benumof, R.↗

Cosmic ray-induced soft errors in static MOS memory cells

Previous analytical models were extended to predict cosmic ray-induced soft error rates in static MOS memory devices. The effect is due to ionization and can be introduced by high energy, heavy ion components of the galactic environment. The results indicate that the sensitivity of memory cells is directly related to the density of the particular MOS technology which determines the node capacitance values. Hence, CMOS is less sensitive than e.g., PMOS. In addition, static MOS memory cells are less sensitive than dynamic ones due to differences in the mechanisms of storing bits. The flip-flop of a static cell is inherently stable against cosmic ray-induced bit flips. Predicted error rates on a CMOS RAM and a PMOS shift register are in general agreement with previous spacecraft flight data.

Sivo, L. L.↗

Update on parts SEE suspectibility from heavy ions

JPL and the Aerospace Corporation have collected a fourth set of heavy ion single event effects (SEE) test data. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are displayed. All data are conveniently divided into two tables: one for MOS devices, and one for a shorter list of recently tested bipolar devices. In addition, a new table of data for latchup tests only (invariably CMOS processes) is given.

Nichols, D. K.↗

Proton Effects and Test Issues for Satellite Designers: Ionization Effects - Section 4

This portion of the Short Course is divided into two segments to separately address the two major proton-related effects confronting satellite designers: ionization effects and displacement damage effects. While both of these topics are deeply rooted in "traditional" descriptions of space radiation effects, there are several factors at play to cause renewed concern for satellite systems being designed today. For example, emphasis on Commercial Off-The-Shelf (COTS) technologies in both commercial and government systems increases both Total Ionizing Dose (TID) and Single Event Effect (SEE) concerns. Scaling trends exacerbate the problems, especially with regard to SEEs where protons can dominate soft error rates and even cause destructive failure. In addition, proton-induced displacement damage at fluences encountered in natural space environments can cause degradation in modern bipolar circuitry as well as in many emerging electronic and opto-electronic technologies. A crude, but nevertheless telling, indication of the level of concern for proton effects follows from surveying the themes treated in papers presented at this conference. The table lists themes found in the IEEE Transaction on Nuclear Science (TNS) December issue from the past year and compares them with the December issue's content a decade earlier. Ten years ago there were nine papers, or about 10% of the total, dealing with the four indicated topics. At that time, single event effects from protons were the primary concern, and these were thought to be possible only when a nuclear reaction initiated energetic recoil atoms. This is shown in the table as the 'traditional" SEE subject. A decade later, submissions addressing this topic had doubled, while papers devoted to displacement damage studies had increased from one to nine! More importantly, displacement damage effects in the natural space environments have become a concern for degradation in modern devices (other than solar cells), and this was not so ten years earlier.

Marshall, Paul W.↗

Space vehicle Viterbi decoder

The design and fabrication of an extremely low-power, constraint-length 7, rate 1/3 Viterbi decoder brassboard capable of operating at information rates of up to 100 kb/s is presented. The brassboard is partitioned to facilitate a later transition to an LSI version requiring even less power. The effect of soft-decision thresholds, path memory lengths, and output selection algorithms on the bit error rate is evaluated. A branch synchronization algorithm is compared with a more conventional approach. The implementation of the decoder and its test set (including all-digital noise source) are described along with the results of various system tests and evaluations. Results and recommendations are presented.

Source record↗

Trellises and Trellis-Based Decoding Algorithms for Linear Block Codes: An Iterative Decoding Algorithm for Linear Block Codes Based on a Low-Weight Trellis Search - Part 3

For long linear block codes, maximum likelihood decoding based on full code trellises would be very hard to implement if not impossible. In this case, we may wish to trade error performance for the reduction in decoding complexity. Sub-optimum soft-decision decoding of a linear block code based on a low-weight sub-trellis can be devised to provide an effective trade-off between error performance and decoding complexity. This chapter presents such a suboptimal decoding algorithm for linear block codes. This decoding algorithm is iterative in nature and based on an optimality test. It has the following important features: (1) a simple method to generate a sequence of candidate code-words, one at a time, for test; (2) a sufficient condition for testing a candidate code-word for optimality; and (3) a low-weight sub-trellis search for finding the most likely (ML) code-word.

Lin, Shu↗

Real-time optimal guidance for orbital maneuvering.

A new formulation for soft-constraint trajectory optimization is presented as a real-time optimal feedback guidance method for multiburn orbital maneuvers. Control is always chosen to minimize burn time plus a quadratic penalty for end condition errors, weighted so that early in the mission (when controllability is greatest) terminal errors are held negligible. Eventually, as controllability diminishes, the method partially relaxes but effectively still compensates perturbations in whatever subspace remains controllable. Although the soft-constraint concept is well-known in optimal control, the present formulation is novel in addressing the loss of controllability inherent in multiple burn orbital maneuvers. Moreover the necessary conditions usually obtained from a Bolza formulation are modified in this case so that the fully hard constraint formulation is a numerically well behaved subcase. As a result convergence properties have been greatly improved.

Cohen, A. O.↗

1999 NSREC Short Course: Proton Effects and Test Issues for Satellite Designers: Displacement Effects

This portion of the Short Course is divided into two segments to separately address the two major proton-related effects confronting satellite designers: ionization effects and displacement damage effects. While both of these topics are deeply rooted in "traditional" descriptions of space radiation effects, there are several factors at play to cause renewed concern for satellite systems being designed today. For example, emphasis on Commercial Off-The-Shelf (COTS) technologies in both commercial and government systems increases both Total Ionizing Dose (TID) and Single Event Effect (SEE) concerns. Scaling trends exacerbate the problems, especially with regard to SEEs where protons can dominate soft error rates and even cause destructive failure. In addition, proton-induced displacement damage at fluences encountered in natural space environments can cause degradation in modern bipolar circuitry as well as in many emerging electronic and opto-electronic technologies.

Marshall, Cheryl J.↗

Single Event Effect Testing of the Micron MT46V128M8

The Micron MT46V128M8 was tested for single event effects (SEE) at the Texas AM University Cyclotron Facility (TAMU) in June of 2017. Testing revealed a sensitivity to device hang-ups classified as single event functional interrupts (SEFI) and possible soft data errors classified as single event upsets (SEU).

Single Event Functional Interrupts (SEFI)↗

Trends in Device SEE Susceptibility from Heavy Ions

The sixth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications in December issues of IEEE - Nuclear Science Transactions for 1985, 1987, 1989, 1991, and the IEEE Workshop Record, 1993. Trends in SEE susceptibility (including soft errors and latchup) for state-of- are evaluated.

single event effects latchup radiation hardening↗

Microcircuit radiation effects databank

Radiation test data submitted by many testers is collated to serve as a reference for engineers who are concerned with and have some knowledge of the effects of the natural radiation environment on microcircuits. Total dose damage information and single event upset cross sections, i.e., the probability of a soft error (bit flip) or of a hard error (latchup) are presented.

Source record↗

Soft X-ray bremsstrahlung and fluorescent line production in the atmosphere by low energy electrons

The effect of low energy quasi-trapped or precipitating electrons which impact on the counter windows of soft X-ray detectors are discussed. The errors caused by X-rays produced in the residual atmosphere above a rocket-borne detector because of the resemblance to X-rays of cosmic origin are examined. The design and development of counter windows which make it possible to identify the atmospherically produced X-rays are described. Curves are presented to show the following: (1) preliminary low energy electron data from Atmospheric Explorer C, (2) X-ray flux in electron-excited nitrogen and oxygen, (3) typical proportional counter response to low energy cosmic rays, and (4) proportional counter response to X-radiation produced by electrons incident upon a gas of oxygen to nitrogen number of 0.4.

Kraushaar, W. L.↗

Fault-tolerant system considerations for a redundant strapdown inertial measurement unit

The development and evaluation of a fault-tolerant system for the Redundant Strapdown Inertial Measurement Unit (RSDIMU) being developed and evaluated by the NASA Langley Research Center was continued. The RSDIMU consists of four two-degree-of-freedom gyros and accelerometers mounted on the faces of a semi-octahedron which can be separated into two halves for damage protection. Compensated and uncompensated fault-tolerant system failure decision algorithms were compared. An algorithm to compensate for sensor noise effects in the fault-tolerant system thresholds was evaluated via simulation. The effects of sensor location and magnitude of the vehicle structural modes on system performance were assessed. A threshold generation algorithm, which incorporates noise compensation and filtered parity equation residuals for structural mode compensation, was evaluated. The effects of the fault-tolerant system on navigational accuracy were also considered. A sensor error parametric study was performed in an attempt to improve the soft failure detection capability without obtaining false alarms. Also examined was an FDI system strategy based on the pairwise comparison of sensor measurements. This strategy has the specific advantage of, in many instances, successfully detecting and isolating up to two simultaneously occurring failures.

Motyka, P.↗